DocumentCode :
3522405
Title :
Mechanism of electrical passivation of Si surfaces with quinhydrone
Author :
Opila, Robert L. ; Yang, Dan ; Kotulak, Nicole ; Costello, Luke ; Chhabra, Bhumika
Author_Institution :
Univ. of Delaware, Newark, DE, USA
fYear :
2012
fDate :
3-8 June 2012
Abstract :
The ability of quinhydrone/methanol solutions to electrically passivate silicon surfaces with respect to minority carrier recombination has been confirmed. The p-benzoquinon has been found to be the active component of quinhydrone. It is the presence of ketones on opposite sides of the ring that acts to passivate the surface, although the exact mechanism of passivation is not understood. The time dependence of the passivation suggests that it includes more than merely repairing damage on hydrogen terminated surfaces.
Keywords :
elemental semiconductors; minority carriers; passivation; silicon; solar cells; Si; electrically passivate silicon surfaces; hydrogen terminated surfaces; minority carrier recombination; p-benzoquinon; photovoltaic technology; quinhydrone-methanol solutions; solar cell; surface electrical passivation mechanism; time dependence; Charge carrier lifetime; Methanol; Passivation; Photovoltaic cells; Silicon; Substrates; benzoquinone; hydrogen-terminated; quinhydrone; silicon; surface passivation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location :
Austin, TX
ISSN :
0160-8371
Print_ISBN :
978-1-4673-0064-3
Type :
conf
DOI :
10.1109/PVSC.2012.6318123
Filename :
6318123
Link To Document :
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