DocumentCode :
3522427
Title :
KATECH´s efforts of the standardization of the Korean digital road map for navigation and implementation of the shortest path algorithm using the vector topology data
Author :
Lee, Soo Young ; Choi, Keechoo ; Kim, Gi-Hoon
Author_Institution :
Div. of Electron. & Syst. Dev., Korea Autom. Technol. Inst., Chungchong-Nam, South Korea
fYear :
1996
fDate :
19-20 Sep 1996
Firstpage :
105
Lastpage :
110
Abstract :
The Korea Automotive Technology Institute (KATECH) is playing a leading role in developing the digital road map database of Korea, which will provide the backbone for vehicle navigation and route guidance. The purpose of this paper is two-fold. First, we briefly introduce what have been done in making and standardizing the digital road map database of Korea so far from the viewpoint of database. Next, the process of the shortest path algorithm implementation using the map is described, with special emphases on the efficiency tests based on two types of tool such as the searching area extraction scheme and bi-directional path algorithm based on the vine-building Dijkstra algorithm. This paper cover the following three issues: 1) inclusion of the issue of both P-TURN and U-TURN movements; 2) a scheme that will curtail the search numbers of nodes in the conventional Dijkstra algorithm; and 3) a bi-directional Dijkstra algorithm implementation with the link labelling scheme
Keywords :
cartography; driver information systems; geographic information systems; navigation; standardisation; visual databases; Dijkstra algorithm; KATECH; Korea Automotive Technology Institute; Korean digital road map; bi-directional path algorithm; link labelling; route guidance; searching area extraction; shortest path algorithm; standardization; vector topology data; vehicle navigation; Automobile manufacture; Automotive engineering; Bidirectional control; Databases; Labeling; Navigation; Road vehicles; Spine; Standardization; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Vehicles Symposium, 1996., Proceedings of the 1996 IEEE
Conference_Location :
Tokyo
Print_ISBN :
0-7803-3652-6
Type :
conf
DOI :
10.1109/IVS.1996.566361
Filename :
566361
Link To Document :
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