• DocumentCode
    3522741
  • Title

    Finite element thermal analysis for high power multi-chip light emitting diode

  • Author

    Zhou, Longzao ; Chen, Hongtao ; An, Bing ; Wu, Fengshun ; Wu, Yiping

  • Author_Institution
    Wuhan Nat. Lab. for Optoelectron., Huazhong Univ. of Sci. & Technol., Wuhan, China
  • fYear
    2009
  • fDate
    10-13 Aug. 2009
  • Firstpage
    164
  • Lastpage
    168
  • Abstract
    In this paper, finite element method (FEM) numerical thermal simulation is performed on the given packaging configuration, and temperature as well as heat flux distribution are obtained. An optimal packaging configuration is obtained by simulating different materials and structures of the heat sink, submount, die attach, different die arrangement styles and die spacing parameters. A reasonable simplification for the high power multi-chip light emitting diode packaging body is performed and a precise FE model is established, and then a high-quality meshing is carried out. A comprehensive simulation is performed to get the temperature distribution of the chip for different materials and structure parameters of certain components; the mechanism of the change of the temperature is analyzed. Simulation results show that an ideal temperature for chip junction under standard input power on the normal working conditions can be obtained through appropriate selection of heat sink structure and material, sub-mount material and structure parameter, die attach material and structure parameter, die arrangement style and spacing parameter.
  • Keywords
    finite element analysis; heat sinks; light emitting diodes; microassembling; semiconductor device packaging; thermal analysis; LED packaging; die attach; die spacing parameter; finite element thermal analysis; heat flux distribution; heat sink; high-power multichip light emitting diode; high-quality meshing; optimal packaging configuration; sub-mount material; Analytical models; Employee welfare; Finite element methods; Heat sinks; Light emitting diodes; Microassembly; Numerical simulation; Packaging; Performance analysis; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging, 2009. ICEPT-HDP '09. International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-4658-2
  • Electronic_ISBN
    978-1-4244-4659-9
  • Type

    conf

  • DOI
    10.1109/ICEPT.2009.5270772
  • Filename
    5270772