• DocumentCode
    3522786
  • Title

    Device limitations and light-soaking effects in CZTSSe and CZTGeSSe

  • Author

    Hages, Charles J. ; Moore, James ; Dongaonkar, Sourabh ; Alam, Muhammad ; Lundstrom, Mark ; Agrawal, Rakesh

  • Author_Institution
    Sch. of Chem. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2012
  • fDate
    3-8 June 2012
  • Abstract
    Advancements in thin film Cu2ZnSn(SxSe1-x)4 (CZTSSe) solar cells have recently achieved power conversion efficiencies >;10%, indicating the potential of this low cost, earth abundant material system as a viable alternative to CIGS and CdTe absorbers [1]. Understanding the limitations in this material system is essential for further advancements in device performance. This work demonstrates the importance of the CdS/CZTSSe interface and conduction band alignment for improving the performance of CZTSSe solar cells. Through incorporation of germanium into CZTSSe, a material with tunable band gap and conduction band level can be achieved. Comparing Cu2Zn(SnyGe1-y)(SxSe1-x) (CZTGeSSe) with standard CZTSSe devices allows for characterization of device limitations as a function of band gap and the conduction band offset at the CdS/CZTSSe interface. This work characterizes the effect of Ge incorporation on recombination, series resistance, and quantum efficiency in CZTSSe.
  • Keywords
    conduction bands; copper compounds; semiconductor thin films; solar cells; ternary semiconductors; zinc compounds; Cu2Zn(SnGe)(SSe)4; conduction band alignment; conduction band level; conduction band offset; earth abundant material system; light soaking effects; power conversion efficiency; quantum efficiency; series resistance; thin film solar cells; tunable band gap; Photonic band gap; Photovoltaic cells; Resistance; Temperature; Temperature dependence; Temperature measurement; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4673-0064-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2012.6318142
  • Filename
    6318142