• DocumentCode
    3522817
  • Title

    Effects of nitrogen on wettability and reliability of lead-free solder in reflow soldering

  • Author

    Dong, Mingzhi ; Wang, Yuming ; Cai, Jian ; Feng, Tao ; Pu, Yuanyuan

  • Author_Institution
    Tsinghua Nat. Lab. for Inf. Sci. & Technol., Beijing, China
  • fYear
    2009
  • fDate
    10-13 Aug. 2009
  • Firstpage
    147
  • Lastpage
    151
  • Abstract
    Electronic assembly technology is in the transition from traditional tin-lead to lead-free, which leading to challenge in many aspects. It is accepted that nitrogen can improve the wettability and reliability of lead-free solders; however, few systemic researches have been reported. In this work, the spreading ratio of Sn-Ag-Cu solder was measured through spreading tests under different atmosphere conditions. When oxygen concentration was 1000ppm and reflow temperature was 5degC lower than non-inerted reflow, the spreading ratio of Sn-Ag-Cu solder was comparable with the non-inerted one. PCBs and SMT components were assembled in nitrogen-inerted (oxygen concentration: 1000ppm) and non-inerted reflow. The nitrogen-inerted reflow temperature was 5degC lower. Pull and shear tests were employed as the evaluation of the soldering. Random vibration test and isothermal aging test were conducted as reliability evaluation. The morphology of the interfacial intermetallic compounds (IMCs) during wetting and reliability tests were studied as well.
  • Keywords
    copper alloys; integrated circuit reliability; printed circuits; reflow soldering; silver alloys; solders; surface mount technology; tin alloys; wetting; PCB components; SMT components; SnAgCu; electronic assembly technology; interfacial intermetallic compounds; isothermal aging test; lead-free solder; morphology; nitrogen effects; reflow soldering; reflow temperature; reliability; wettability; Assembly; Atmosphere; Atmospheric measurements; Environmentally friendly manufacturing techniques; Lead; Nitrogen; Reflow soldering; Surface-mount technology; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging, 2009. ICEPT-HDP '09. International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-4658-2
  • Electronic_ISBN
    978-1-4244-4659-9
  • Type

    conf

  • DOI
    10.1109/ICEPT.2009.5270776
  • Filename
    5270776