DocumentCode :
3522950
Title :
ES-debugger : the flexible embedded system debugger based on JTAG technology
Author :
Chun, Igeol ; Lim, Chaedeok
Author_Institution :
Embedded S/W Res. Div., Electron. & Telecommun. Res. Inst., Taejeon
Volume :
2
fYear :
0
fDate :
0-0 0
Firstpage :
900
Lastpage :
903
Abstract :
In the past the Embedded Software was used for controlling industrial apparatus but now is used in control systems for military, home appliances and automatic sensor systems and so on at present. Embedded systems are different from conventional computer system and this distinction makes it much difficult to debug as well as develop the embedded systems because of the lack of resources and sensitiveness in target system such as memory, power, timing constraint, etc. Especially huge integrated system like SoC (System-on-a-Chip)-that has memory, I/O port, etc.-has no space to locate debugging gadget so that the debugging of the embedded system is more difficult. To solve above problem, Boundary scan testing (also named JTAG) is appeared and we proposed the embedded system debugger based on JTAG technology in this paper
Keywords :
IEEE standards; boundary scan testing; domestic appliances; electronic products; embedded systems; integrated circuit testing; program debugging; sensors; system-on-chip; ES-debugger; JTAG technology; SoC; automatic sensor system; boundary scan testing; embedded software; embedded system debugger; industrial apparatus control; joint test action group; military-home appliance control system; system-on-a-chip; Automatic control; Computer industry; Control systems; Debugging; Defense industry; Electrical equipment industry; Embedded software; Embedded system; Military computing; Space technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Communication Technology, 2005, ICACT 2005. The 7th International Conference on
Conference_Location :
Phoenix Park
Type :
conf
DOI :
10.1109/ICACT.2005.246099
Filename :
1462923
Link To Document :
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