DocumentCode
3523104
Title
Aliveness Detection for IRIS Biometrics
Author
Pacut, Andrzej ; Czajka, Adam
Author_Institution
Inst. of Control & Comput. Eng., Warsaw Univ. of Technol.
fYear
2006
fDate
Oct. 2006
Firstpage
122
Lastpage
129
Abstract
Various experiments show an alarming lack of anti-spoofing mechanisms in devices already protecting many sensitive areas all over the world, proving that aliveness detection methods must be quickly included in commercial equipment. To introduce and systemize the topic, the paper begins with a survey of possible types of eye forgery, together with possible countermeasures. The authors introduce three solutions of eye aliveness detection, based on analyses of image frequency spectrum, controlled light reflection from the cornea, and pupil dynamics. A body of various fake (printed) eye images was used to test the developed methodologies, including different printers and printout carriers. The proposed methodology was embedded into the NASK iris recognition system and showed its large potential. For a local database of pairs of alive and printed eyes, all methods proposed in the paper revealed zero false acceptance rate of fakes FAR-F. The false rejection rate of genuines FRR-G reached 2.8% for the first proposed solution, and showed null value for the next two proposed methods. This very favorable compares to the commercial equipment tested: two popular iris cameras accepted 73% and 15% of the prepared fake irises
Keywords
biometrics (access control); eye; image recognition; aliveness detection; anti-spoofing mechanisms; biometrics; eye forgery; false acceptance rate of fakes; false rejection rate of genuines; image frequency spectrum; iris recognition; light reflection; pupil dynamics; Biometrics; Cornea; Forgery; Frequency; Image analysis; Iris; Lighting control; Optical reflection; Protection; Testing; aliveness detection; biometrics; iris recognition;
fLanguage
English
Publisher
ieee
Conference_Titel
Carnahan Conferences Security Technology, Proceedings 2006 40th Annual IEEE International
Conference_Location
Lexington, KY
Print_ISBN
1-4244-0174-7
Type
conf
DOI
10.1109/CCST.2006.313440
Filename
4105327
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