DocumentCode
3523252
Title
Photocurrent transients in polymer-fullerene bulk heterojunction organic solar cells
Author
Li, Lijun ; Li, Kejia ; Khlyabich, Petr P. ; Burkhart, Beate ; Thompson, Barry C. ; Campbell, Joe C.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Virginia, Charlottesville, VA, USA
fYear
2012
fDate
3-8 June 2012
Abstract
By measuring the transient photocurrents we study the charge carrier dynamics in regioregular poly(3-hexylthiophene) (P3HT): 6,6-phenyl-C61-butyric acid methyl ester (PCBM), and poly(3-hexylthiophene) thiophene thienopyrazine (P3HTT-TP):PCBM bulk heterojunction (BHJ) solar cells. The latter is based on a novel “semi-random” copolymer and exhibits broad spectral absorption. We observe that the charge carrier transport in P3HTT-TP:PCBM is more imbalanced than that of P3HT:PCBM. Voltage dependent photocurrent transients indicate that P3HT:PCBM has longer carrier lifetimes than P3HTT-TP:PCBM. Light intensity dependent open-circuit voltage measurements show stronger monomolecular recombination in P3HTT-TP:PCBM. The unfavorable charge carrier transport may be one of the reasons for the low power conversion efficiency of P3HTT-TP:PCBM BHJ solar cells.
Keywords
photoconductivity; solar cells; (P3HTT-TP):P CBM bulk heterojunction solar cells; 6,6-phenyl-C61-butyric acid methyl ester; P3HTT-TP:P CBM BHJ solar cells; charge carrier dynamics; charge carrier transport; light intensity dependent open-circuit voltage measurements; low power conversion efficiency; photocurrent transients; poly(3-hexylthiophene) thiophene thienopyrazine; polymer-fullerene bulk heterojunction organic solar cells; regioregular poly(3-hexylthiophene); transient photocurrents; voltage dependent photocurrent transients; Charge carriers; Heterojunctions; Photoconductivity; Photovoltaic cells; Polymers; Power conversion; Transient analysis; charge carrier lifetime; organic semiconductors; photovoltaic cells; polymer films;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location
Austin, TX
ISSN
0160-8371
Print_ISBN
978-1-4673-0064-3
Type
conf
DOI
10.1109/PVSC.2012.6318164
Filename
6318164
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