• DocumentCode
    3523469
  • Title

    Radiation effect models in solar cells - Comparison of simulations with experimental data

  • Author

    Fedoseyev, Alex ; Bald, Tim ; Turowski, Marek ; Raman, Ashok ; Cress, Cory ; Walters, Robert ; Warner, Jeff ; Hubbard, Seth

  • Author_Institution
    CFDRC, Huntsville, AL, USA
  • fYear
    2012
  • fDate
    3-8 June 2012
  • Abstract
    We present the radiation effect models for solar cells used in NanoTCAD device simulator and provide comparison with experimentally measured on solar cell performance. The device modeled is a p+ n GaAs solar cell. Dark, Light IV curves and corresponding performance parameters are simulated and compared with experimental results for 2 MeV protons at varying fluence. Majority carrier defect introduction rates for n-type GaAs used in the NanoTCAD simulations were taken from deep level transient spectroscopy (DLTS) data provided by the Naval Research Lab (NRL). Results show a good match between simulations and experimental results.
  • Keywords
    III-V semiconductors; gallium arsenide; solar cells; DLTS data; GaAs; NRL; NanoTCAD device simulator; Naval Research Lab; deep level transient spectroscopy data; electron volt energy 2 MeV; light IV curves; p+ solar cell; radiation effect models; Current measurement; Degradation; Electron traps; Mathematical model; Photovoltaic cells; Voltage measurement; Experimental data; Radiation Effects Models; Simulation; Solar cells; TCAD;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4673-0064-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2012.6318174
  • Filename
    6318174