• DocumentCode
    3523817
  • Title

    Towards heterogeneous microsystems design-for-test in a graduate student environment

  • Author

    Stokes, Peter A. ; Mallard, Robert E.

  • Author_Institution
    CMC Microsyst., Kingston, ON, Canada
  • fYear
    2009
  • fDate
    25-27 July 2009
  • Firstpage
    81
  • Lastpage
    84
  • Abstract
    Advances in the microfabrication of heterogeneous microsystems is enabling increasingly complex devices. Modeling, simulation and test methodologies are unable to keep pace. Custom test solutions require significant resources to implement and are often not reusable. Devices not performing as expected are difficult to diagnose. Design-for-testability techniques familiar to silicon microelectronics designers may offer solutions for validating and debugging designs. What is desirable is a system design and operational algorithm optimization in a rapid prototyping environment that incorporates design for testability considerations. The university research setting is particularly well suited for developing such an environment. In this paper, we review some of the generic tests performed on microsystems-based sensor systems by graduate students. Taking a research infrastructure perspective, we then propose improvements to proof of concept environments in universities to facilitate addition of design-for-test features into heterogeneous microsystems.
  • Keywords
    microfabrication; microsensors; generic test; graduate student environment; heterogeneous microsystem design-for-test; microfabrication; microsystem-based sensor system; Application software; Design for testability; Design methodology; Design optimization; Fabrication; Manufacturing; Microfluidics; Prototypes; Software prototyping; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Systems Education, 2009. MSE '09. IEEE International Conference on
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    978-1-4244-4407-6
  • Electronic_ISBN
    978-1-4244-4406-9
  • Type

    conf

  • DOI
    10.1109/MSE.2009.5270823
  • Filename
    5270823