DocumentCode :
3523896
Title :
Space Charge in XLPE Near the Electrode Interfaces
Author :
Fleming, R.J. ; Lang, S.B. ; Pawlowski, T.
Author_Institution :
Sch. of Phys., Monash Univ., Vic.
fYear :
2006
fDate :
15-18 Oct. 2006
Firstpage :
69
Lastpage :
72
Abstract :
Electric field and space charge profiles were measured in 110 mum thick planar XLPE samples machined from the insulation of power transmission cables. The samples carried vacuum-evaporated aluminium electrodes, and were poled at field-strengths around 50 kV/mm (both polarities) for periods up to 48 hr. The electric field and space charge profiles were measured using the LIMM technique. The experimental data were analysed using a combination of the polynomial regularization method (PRM) and the L-curve method (LCM). The profiles were recorded immediately after the end of poling, and after the sample had been grounded for various times. The spatial resolution of the profiles in the thickness direction was 1-2 mum. Negative space charge densities up to 400 C m-3 and negative field strengths up to 20 kV/mm were recorded at distances 1-2 mum from the cathode immediately after poling. Within similar distances of the anode the corresponding figures were +300 to -100 C m-3 and -5 to +5 kV/mm. In one sample the space charge profile decayed rapidly with time in short circuit, but in two others the decay rate was negligible.
Keywords :
XLPE insulation; electric fields; electrodes; power cable insulation; space charge; 110 micron; L-curve method; LIMM technique; XLPE; electric field profile; electrode interface; field strength; polynomial regularization method; power transmission cable insulation; space charge density; space charge profile; vacuum-evaporated aluminium electrode; Cable insulation; Charge measurement; Current measurement; Dielectrics and electrical insulation; Electric variables measurement; Electrodes; Power measurement; Power transmission; Space charge; Thickness measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2006 IEEE Conference on
Conference_Location :
Kansas City, MO
Print_ISBN :
1-4244-0547-5
Electronic_ISBN :
1-4244-0547-5
Type :
conf
DOI :
10.1109/CEIDP.2006.312064
Filename :
4105372
Link To Document :
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