DocumentCode :
3524235
Title :
Characterization of a quantum dot nipi photovoltaic device
Author :
Slocum, Michael A. ; Forbes, David V. ; Roland, Paul ; Ellingson, Randall ; Hubbard, Seth M.
Author_Institution :
Rochester Inst. of Technol., Rochester, NY, USA
fYear :
2012
fDate :
3-8 June 2012
Abstract :
Quantum dot nipi test structures consisting of n-type / intrinsic / p-type / intrinsic layers have been developed to probe the effects of placing quantum dots within a doping superlattice. Coupling between the doping superlattice states and quantum dots that can be grown within the superlattice results in increases in carrier lifetimes within the quantum dots, and modifies the absorption spectrum. With the addition of dots within a nipi device, the benefits have been quantified by measuring absorption, activation energy, photoluminescence, and lifetime. By characterizing the modified quantum dot properties, it is hopeful that this will demonstrate the potential of the nipi structure as an intermediate band solar cell candidate.
Keywords :
quantum dots; solar cells; absorption measurement; absorption spectrum; activation energy measurement; carrier lifetimes; doping superlattice states; intermediate band solar cell candidate; lifetime measurement; photoluminescence measurement; quantum dot nipi photovoltaic device characterization; quantum dot nipi test structures; quantum dot properties; confinement; doping superlattice; nipi; quantum dot;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location :
Austin, TX
ISSN :
0160-8371
Print_ISBN :
978-1-4673-0064-3
Type :
conf
DOI :
10.1109/PVSC.2012.6318208
Filename :
6318208
Link To Document :
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