How to characterize intense femtosecond lasers pulses by cross-phase modulation

Author

Ripoche, J.-F. ; Lange, R. ; Franco, M.A. ; Prade, B.S. ; Mysyrowicz, A.

Author_Institution

Lab. d´Opt. Appliquee, ENSTA-Ecole Polytech., Palaiseau, France

fYear

1998

fDate

3-8 May 1998

Firstpage

164

Lastpage

165

Abstract

Summary form only given. With the rapid progress in femtosecond laser technology, the accurate measurement of pulse time profile becomes a more and more important issue. Several diagnostics techniques have been demonstrated, which go beyond the 2/spl omega/ autocorrelation method. We show in this presentation that methods based on spectrally resolved cross-phase modulation (XPM) provide a powerful and simple tool for femtosecond pulses analysis. Two distinct physical processes are exploited: multiphoton ionization (MPI) in a neutral gas or instantaneous optical Kerr effect (OKE) in a transparent solid.

Keywords

high-speed optical techniques; laser variables measurement; multiphoton processes; optical Kerr effect; optical modulation; phase modulation; photoionisation; cross-phase modulation; intense femtosecond laser pulse diagnostics; multiphoton ionization; optical Kerr effect; spectral resolution; time profile measurement; Autocorrelation; Ionization; Kerr effect; Nonlinear optics; Optical modulation; Optical pulses; Pulse measurements; Pulse modulation; Time measurement; Ultrafast optics;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 1998. CLEO 98. Technical Digest. Summaries of papers presented at the Conference on

Conference_Location

San Francisco, CA, USA

Print_ISBN

1-55752-339-0

Type

conf

DOI

10.1109/CLEO.1998.676003

Filename

676003