• DocumentCode
    3524361
  • Title

    Multi-pass maximum likelihood technique for self localisation in wireless sensor networks

  • Author

    Bessell, Travis J. ; Rutten, Mark G.

  • Author_Institution
    ISR Div., Defence Sci. & Technol. Organ. (DSTO), Edinburgh, WA, Australia
  • fYear
    2009
  • fDate
    7-10 Dec. 2009
  • Firstpage
    157
  • Lastpage
    162
  • Abstract
    An accurate self-localisation capability is highly desirable in wireless sensor networks. This paper presents a multi-pass algorithm, based on maximum likelihood optimisation to estimate the locations of sensor nodes within a network using range based measurements. Flip ambiguities are a major problem in trilateration based localisation, which has the potential to introduce large errors in the location estimates. The notion of robust quadrilaterals has been incorporated with the multi-pass algorithm to identify these flip ambiguities and provide good starting positions for the optimisation. The Crame¿r-Rao Bound of the estimation error has been derived which is used to analyse the accuracy of the algorithm. By fusing two complementary range-based measurements it is observed that the multi-pass algorithm follows the calculated bound on simulated data. Experiments using real data from MICAz motes demonstrate that the algorithm can maintain this accuracy in a real environment.
  • Keywords
    maximum likelihood estimation; sensor placement; wireless sensor networks; Cramer-Rao Bound; estimation error; multi-pass maximum likelihood technique; self localisation; wireless sensor networks; Acoustic measurements; Australia; Estimation error; Global Positioning System; Hardware; Maximum likelihood estimation; Position measurement; Robustness; Sensor systems; Wireless sensor networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Sensors, Sensor Networks and Information Processing (ISSNIP), 2009 5th International Conference on
  • Conference_Location
    Melbourne, VIC
  • Print_ISBN
    978-1-4244-3517-3
  • Electronic_ISBN
    978-1-4244-3518-0
  • Type

    conf

  • DOI
    10.1109/ISSNIP.2009.5416801
  • Filename
    5416801