Title :
Optical modeling and optimization of flattened light-scattering substrate for thin-film silicon solar cells
Author :
Isabella, Olindo ; Sai, Hitoshi ; Kondo, Michio ; Zeman, Miro
Author_Institution :
Photovoltaic Mater. & Devices Lab., Delft Univ. of Technol., Delft, Netherlands
Abstract :
The Flattened Light-Scattering Substrate (FLiSS) is a two-dimensional grating-based back reflector. Embedded in thin film silicon solar cells, it increases spectral response in the infrared region and delivers high-end open circuit voltage and fill factor, due to the roughness-free surface. An accurate three-dimensional optical modeling based on finite element method was carried out for implementation in efficient thin-film silicon solar cells. Three types of FLiSS shapes, different materials, and wide period/height ranges were simulated. Optimal FLiSS design results in a photo-current density of 27.4 mA/cm2 for a 1 μm thick flat nip μc-Si:H single junction solar cell.
Keywords :
current density; elemental semiconductors; finite element analysis; photoconductivity; photoemission; silicon; solar cells; thin films; FEM; FLiSS shapes; Si:H; fill factor; finite element method; flattened light-scattering substrate; high-end open circuit voltage; period-height ranges; photocurrent density; roughness-free surface; single junction solar cell; size 1 mum; spectral response; thin film solar cells; three-dimensional optical modeling; two-dimensional grating-based back reflector; Indexes; MIMICs; Optical films; Optical imaging; Optical sensors; Shape; absorption; electromagnetic modeling; numerical simulation; optimization; periodic structures photovoltaic cells; silicon; thin film devices;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4673-0064-3
DOI :
10.1109/PVSC.2012.6318220
