Title :
Femtosecond technology in Japan: today and tomorrow
Author :
Yajima, Hiroya ; Endo, Miyuki
Keywords :
Bit error rate; Diodes; Electrons; Face detection; Information technology; Optical signal processing; Polarization; Signal detection; Ultrafast electronics; Ultrafast optics;
Conference_Titel :
Lasers and Electro-Optics, 1995. Technical Digest. CLEO/Pacific Rim'95., Pacific Rim Conference on
Conference_Location :
Chiba, Japan
Print_ISBN :
0-7803-2400-5
DOI :
10.1109/CLEOPR.1995.527096