• DocumentCode
    352461
  • Title

    Use of local entropy changes as a measure for identification of facial expressions

  • Author

    Gokcay, D. ; Bowers, D. ; Rochardson, C. ; Desai, A.

  • Author_Institution
    Cognitive Neurosci. Lab., Univ. of Florida Brain Inst., Gainesville, FL, USA
  • Volume
    6
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    2334
  • Abstract
    Facial expression recognition systems have developed rapidly. Most of the current systems are based on complex measures such as motion parameters, or models of muscular activity. On the other hand, entropy is a simple, yet powerful tool in discriminating activity in subsequent frames. In this study, we examined the use of local entropy changes in the identification of facial expressions. Six basic emotional facial expressions are collected from subjects as video sequences. The face is partitioned into rectangular boxes blindly, without considering the location of facial features. A Bayesian classifier is used to identify the expressions by looking at the patterns of entropy changes in the individual boxes. The results are satisfactory for the three expressions happy, surprised and sad, and exhibit consistency with the behavioral pattern reported in psychology literature
  • Keywords
    Bayes methods; entropy; face recognition; feature extraction; image classification; image sequences; video coding; Bayesian classifier; behavioral pattern; emotional facial expressions; facial expression recognition systems; facial expressions coding; feature vectors extraction; happy; identification; local entropy changes; local probabilities; motion parameters; muscular activity models; psychology; rectangular boxes; sad; surprised; video sequences; Bayesian methods; Current measurement; Entropy; Face recognition; Facial features; Head; Lighting; Motion measurement; Neuroscience; Power system modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Acoustics, Speech, and Signal Processing, 2000. ICASSP '00. Proceedings. 2000 IEEE International Conference on
  • Conference_Location
    Istanbul
  • ISSN
    1520-6149
  • Print_ISBN
    0-7803-6293-4
  • Type

    conf

  • DOI
    10.1109/ICASSP.2000.859308
  • Filename
    859308