• DocumentCode
    3524698
  • Title

    Development of a fourth generation industrial tomography for multiphase systems analysis

  • Author

    Mesquita, C.H. ; Dantas, C.R. ; Costa, F.E. ; Carvalho, D.V.S. ; Filho, Tufic Madi ; Vasquez, P.A.S. ; Hamada, M.M.

  • Author_Institution
    IPEN, CNEN-SP, São Paulo, Brazil
  • fYear
    2010
  • fDate
    Oct. 30 2010-Nov. 6 2010
  • Firstpage
    19
  • Lastpage
    23
  • Abstract
    In the present work a 4D (three dimensions combined with the time) fourth generation CT system was developed with several detectors (as much as required) made with CsI (Tl) size of 5 mm × 20 mm width × length) coupled to PIN photodiodes size of 5 × 5 mm2. It was also developed a pulse sensitive preamplifier in a small electronic circuit board with size of 9.5 × 100 mm2 (width × length). This system was able to identify 80 keV photopeak at room temperature and was obtained a photo peak counting efficiency around 33% for 137Cs. The proposed CT was assembled on a wooden platform, where the cylindrical detectors (photodiode + preamplifier + CsI (Tl) crystal) are arranged in pentagonal parallel or fan sectors. Five sources of 137Cs or jointly with 133Ba or 192Ir are assembled at the vertices. Each detector was supplied with three power supplies: +12V,-12V and adjustable high voltage HV (capable to range from 0 to 2000V). The pre-amplifier signal was connected to a data acquisition unit containing amplifier, counter unit and transfer data via USB-2 cable to a computer type PC-Windows. The system was easily adaptable to the environment of the industries and able to produce multi-phase analysis in real time.
  • Keywords
    X-ray apparatus; X-ray microscopy; computerised tomography; photodiodes; preamplifiers; system buses; PIN photodiodes; USB-2 cable; computer type PC-Windows; counter unit; data transmission; electronic circuit board; fourth generation CT system; fourth generation industrial tomography; multiphase systems analysis; pulse sensitive preamplifier; temperature 293 K to 298 K; voltage 0 V to 2000 V; Computed tomography; Data acquisition; Detectors; PIN photodiodes; Preamplifiers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
  • Conference_Location
    Knoxville, TN
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-9106-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2010.5873710
  • Filename
    5873710