DocumentCode :
3524698
Title :
Development of a fourth generation industrial tomography for multiphase systems analysis
Author :
Mesquita, C.H. ; Dantas, C.R. ; Costa, F.E. ; Carvalho, D.V.S. ; Filho, Tufic Madi ; Vasquez, P.A.S. ; Hamada, M.M.
Author_Institution :
IPEN, CNEN-SP, São Paulo, Brazil
fYear :
2010
fDate :
Oct. 30 2010-Nov. 6 2010
Firstpage :
19
Lastpage :
23
Abstract :
In the present work a 4D (three dimensions combined with the time) fourth generation CT system was developed with several detectors (as much as required) made with CsI (Tl) size of 5 mm × 20 mm width × length) coupled to PIN photodiodes size of 5 × 5 mm2. It was also developed a pulse sensitive preamplifier in a small electronic circuit board with size of 9.5 × 100 mm2 (width × length). This system was able to identify 80 keV photopeak at room temperature and was obtained a photo peak counting efficiency around 33% for 137Cs. The proposed CT was assembled on a wooden platform, where the cylindrical detectors (photodiode + preamplifier + CsI (Tl) crystal) are arranged in pentagonal parallel or fan sectors. Five sources of 137Cs or jointly with 133Ba or 192Ir are assembled at the vertices. Each detector was supplied with three power supplies: +12V,-12V and adjustable high voltage HV (capable to range from 0 to 2000V). The pre-amplifier signal was connected to a data acquisition unit containing amplifier, counter unit and transfer data via USB-2 cable to a computer type PC-Windows. The system was easily adaptable to the environment of the industries and able to produce multi-phase analysis in real time.
Keywords :
X-ray apparatus; X-ray microscopy; computerised tomography; photodiodes; preamplifiers; system buses; PIN photodiodes; USB-2 cable; computer type PC-Windows; counter unit; data transmission; electronic circuit board; fourth generation CT system; fourth generation industrial tomography; multiphase systems analysis; pulse sensitive preamplifier; temperature 293 K to 298 K; voltage 0 V to 2000 V; Computed tomography; Data acquisition; Detectors; PIN photodiodes; Preamplifiers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location :
Knoxville, TN
ISSN :
1095-7863
Print_ISBN :
978-1-4244-9106-3
Type :
conf
DOI :
10.1109/NSSMIC.2010.5873710
Filename :
5873710
Link To Document :
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