• DocumentCode
    3524750
  • Title

    Development and characterization of new 256 × 256 pixel DEPFET detectors for X-ray astronomy

  • Author

    Meuris, Aline ; Aschauer, Florian ; Herrmann, Sven ; Lauf, Thomas ; Lechner, Peter ; Lutz, Gerhard ; Majewski, Petra ; Miessner, Danilo ; Porro, Matteo ; Reiffers, Jonas ; Stefanescu, Alexander ; Strueder, Lothar ; Treis, Johannes

  • Author_Institution
    Max-Planck-Inst. fur extraterrestrische Phys., Garching, Germany
  • fYear
    2010
  • fDate
    Oct. 30 2010-Nov. 6 2010
  • Firstpage
    38
  • Lastpage
    42
  • Abstract
    DEPFET detectors are silicon active pixel sensors for X-ray imaging spectroscopy. They will be used for the MIXS instrument of BepiColombo planetary mission and they are foreseen for the Wide Field Imager of the International X-ray Observatory currently in study with ESA, NASA and JAXA. New DEPFET matrixes with 256 × 256 pixels of 75 μm pitch have been produced, mounted on ceramic boards with dedicated front-end electronics and integrated in a new set-up able to acquire large-format images and spectra. Excellent homogeneity has been observed on two samples. Energy resolution as low as 129 eV FWHM at 5.9 keV has been obtained including all single events of the matrix back illuminated at -40°C and read out at a 300 frames per second rate. Experimental methods and results are reported.
  • Keywords
    X-ray astronomy; X-ray imaging; astronomical instruments; nuclear electronics; planetary rovers; silicon radiation detectors; BepiColombo planetary mission; ESA; International X-ray Observatory; JAXA; MIXS instrument; NASA; Wide Field Imager; X-ray astronomy; X-ray imaging spectroscopy; ceramic boards; front-end electronics; high energy astrophysics; pixel DEPFET detectors; readout electronics; silicon active pixel sensors; Detectors; Electric potential; Logic gates; Noise; Pixel; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
  • Conference_Location
    Knoxville, TN
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-9106-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2010.5873713
  • Filename
    5873713