DocumentCode
3524757
Title
Evaluation of gassing materials in switching devices using monochromatic high speed imaging technique
Author
Zhou, Xin
Author_Institution
Innovation Center, Eaton Corp., Milwaukee, WI, USA
fYear
2001
fDate
2001
Firstpage
134
Lastpage
140
Abstract
The purpose of this paper is to investigate quantitative information on prospective gassing materials to be used in switching devices. Previous work indicates that gassing materials have a strong effect on current interruption and current limiting in these devices. However, few papers have been published to cover quantitative information on the amount of certain gassing species released, such as hydrogen, when the gassing material is exposed to a running arc. Monochromatic high speed imaging techniques were employed in this investigation to characterize hydrogen gassing properties of different materials based on hydrogen arc images and nitrogen arc images, respectively. Hydrogen plasma has a very high thermal conductivity that results in high arc voltages during interruption, which is critical to current limiting. Comparison among prospective gassing materials was made. The mass loss results derived from plasma emission intensities showed good agreement with direct mass loss measurements of gassing materials
Keywords
circuit-breaking arcs; electric strength; gaseous insulation; image processing; spectrochemical analysis; switches; H2; N2; arc voltages; current interruption; current limiting; direct mass loss measurements; gassing materials; gassing species release; hydrogen; hydrogen arc images; hydrogen gassing properties; hydrogen plasma; mass loss; monochromatic high speed imaging technique; nitrogen arc images; plasma emission intensity; running arc exposure; switching devices; thermal conductivity; Conducting materials; Current limiters; Hydrogen; Loss measurement; Nitrogen; Plasma materials processing; Plasma measurements; Plasma properties; Thermal conductivity; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Contacts, 2001. Proceedings of the Forty-Seventh IEEE Holm Conference on
Conference_Location
Montreal, Que.
Print_ISBN
0-7803-6667-0
Type
conf
DOI
10.1109/HOLM.2001.953201
Filename
953201
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