• DocumentCode
    3524760
  • Title

    3D IR Metamaterial Science and Technology at Sandia National Laboratories

  • Author

    McCormick, F.

  • Author_Institution
    Phys., Chem., & Nanosci. Center, Sandia Nat. Labs., Albuquerque, NM, USA
  • fYear
    2011
  • fDate
    7-8 Nov. 2011
  • Firstpage
    44
  • Lastpage
    47
  • Abstract
    Sandia National Laboratories´ Metamaterial Science and Technology Program has developed novel HPC-based design tools, wafer scale 3D fabrication processes, and characterization tools to enable thermal IR optical metamaterial application studies.
  • Keywords
    Fourier transform spectra; Fourier transform spectroscopy; ellipsometry; infrared spectra; infrared spectroscopy; optical design techniques; optical fabrication; optical metamaterials; reviews; wafer-scale integration; FTIR ellispsometry; HPC-based design tools; IR ellispsometry; Sandia National Laboratories; infrared metamaterials; interferometric FTIR spectroscopy; thermal IR optical metamaterial; ultrafast IR time-domain spectroscopy; wafer scale 3D fabrication; Magnetic losses; Magnetic resonance imaging; Optical imaging; Optical losses; Photonics; LWIR; metamaterials; nanophotonics; plasmonics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Future of Instrumentation International Workshop (FIIW), 2011
  • Conference_Location
    Oak Ridge, TN
  • Print_ISBN
    978-1-4673-5835-4
  • Type

    conf

  • DOI
    10.1109/FIIW.2011.6476799
  • Filename
    6476799
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3524760