DocumentCode :
3524760
Title :
3D IR Metamaterial Science and Technology at Sandia National Laboratories
Author :
McCormick, F.
Author_Institution :
Phys., Chem., & Nanosci. Center, Sandia Nat. Labs., Albuquerque, NM, USA
fYear :
2011
fDate :
7-8 Nov. 2011
Firstpage :
44
Lastpage :
47
Abstract :
Sandia National Laboratories´ Metamaterial Science and Technology Program has developed novel HPC-based design tools, wafer scale 3D fabrication processes, and characterization tools to enable thermal IR optical metamaterial application studies.
Keywords :
Fourier transform spectra; Fourier transform spectroscopy; ellipsometry; infrared spectra; infrared spectroscopy; optical design techniques; optical fabrication; optical metamaterials; reviews; wafer-scale integration; FTIR ellispsometry; HPC-based design tools; IR ellispsometry; Sandia National Laboratories; infrared metamaterials; interferometric FTIR spectroscopy; thermal IR optical metamaterial; ultrafast IR time-domain spectroscopy; wafer scale 3D fabrication; Magnetic losses; Magnetic resonance imaging; Optical imaging; Optical losses; Photonics; LWIR; metamaterials; nanophotonics; plasmonics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Future of Instrumentation International Workshop (FIIW), 2011
Conference_Location :
Oak Ridge, TN
Print_ISBN :
978-1-4673-5835-4
Type :
conf
DOI :
10.1109/FIIW.2011.6476799
Filename :
6476799
Link To Document :
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