DocumentCode
3524931
Title
Ionisation models for nano-scale simulation
Author
Seo, Hee ; Pia, Maria Grazia ; Saracco, Paolo ; Kim, Chan Hyeong
Author_Institution
Dept. of Nucl. Eng., Hanyang Univ., Seoul, South Korea
fYear
2010
fDate
Oct. 30 2010-Nov. 6 2010
Firstpage
86
Lastpage
89
Abstract
Two theory-driven models of electron ionization cross sections, the Binary-Encounter-Bethe model and the Deutsch-Märk model, have been design and implemented; they are intended to extend the simulation capabilities of the Geant4 toolkit. The resulting values, along with the cross sections included in the EEDL data library, have been compared to an extensive set of experimental data, covering more than 50 elements over the whole periodic table.
Keywords
electron impact ionisation; high energy physics instrumentation computing; Deutsch-Mark model; EEDL data library; Geant4 toolkit; binary-encounter-Bethe model; electron impact ionisation; electron ionization cross section; ionisation model; nanoscale simulation; Accuracy; Atomic measurements; Biological system modeling; Data models; Delta modulation; Ionization; Software;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location
Knoxville, TN
ISSN
1095-7863
Print_ISBN
978-1-4244-9106-3
Type
conf
DOI
10.1109/NSSMIC.2010.5873721
Filename
5873721
Link To Document