DocumentCode :
3524931
Title :
Ionisation models for nano-scale simulation
Author :
Seo, Hee ; Pia, Maria Grazia ; Saracco, Paolo ; Kim, Chan Hyeong
Author_Institution :
Dept. of Nucl. Eng., Hanyang Univ., Seoul, South Korea
fYear :
2010
fDate :
Oct. 30 2010-Nov. 6 2010
Firstpage :
86
Lastpage :
89
Abstract :
Two theory-driven models of electron ionization cross sections, the Binary-Encounter-Bethe model and the Deutsch-Märk model, have been design and implemented; they are intended to extend the simulation capabilities of the Geant4 toolkit. The resulting values, along with the cross sections included in the EEDL data library, have been compared to an extensive set of experimental data, covering more than 50 elements over the whole periodic table.
Keywords :
electron impact ionisation; high energy physics instrumentation computing; Deutsch-Mark model; EEDL data library; Geant4 toolkit; binary-encounter-Bethe model; electron impact ionisation; electron ionization cross section; ionisation model; nanoscale simulation; Accuracy; Atomic measurements; Biological system modeling; Data models; Delta modulation; Ionization; Software;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location :
Knoxville, TN
ISSN :
1095-7863
Print_ISBN :
978-1-4244-9106-3
Type :
conf
DOI :
10.1109/NSSMIC.2010.5873721
Filename :
5873721
Link To Document :
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