• DocumentCode
    3524931
  • Title

    Ionisation models for nano-scale simulation

  • Author

    Seo, Hee ; Pia, Maria Grazia ; Saracco, Paolo ; Kim, Chan Hyeong

  • Author_Institution
    Dept. of Nucl. Eng., Hanyang Univ., Seoul, South Korea
  • fYear
    2010
  • fDate
    Oct. 30 2010-Nov. 6 2010
  • Firstpage
    86
  • Lastpage
    89
  • Abstract
    Two theory-driven models of electron ionization cross sections, the Binary-Encounter-Bethe model and the Deutsch-Märk model, have been design and implemented; they are intended to extend the simulation capabilities of the Geant4 toolkit. The resulting values, along with the cross sections included in the EEDL data library, have been compared to an extensive set of experimental data, covering more than 50 elements over the whole periodic table.
  • Keywords
    electron impact ionisation; high energy physics instrumentation computing; Deutsch-Mark model; EEDL data library; Geant4 toolkit; binary-encounter-Bethe model; electron impact ionisation; electron ionization cross section; ionisation model; nanoscale simulation; Accuracy; Atomic measurements; Biological system modeling; Data models; Delta modulation; Ionization; Software;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
  • Conference_Location
    Knoxville, TN
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-9106-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2010.5873721
  • Filename
    5873721