• DocumentCode
    3524993
  • Title

    Fretting corrosion studies of an extrinsic conducting polymer and tin interface

  • Author

    Swingler, J. ; McBride, J.W.

  • Author_Institution
    Sch. of Eng. Sci., Southampton Univ., UK
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    215
  • Lastpage
    219
  • Abstract
    Novel contact connector materials such as conducting polymers are becoming available which improve performance and enable further miniaturisation. Studies of a polymer-tin interface have been carried out to characterise contact resistance performance under fretting conditions. Degradation mechanisms have been identified using contact resistance measurements and surface analysis tools. These mechanisms have been shown to be different to those found in the tin-tin interface. The polymer-tin interface performs significantly better than a clean tin-tin interface, requiring more than three times the number of fretting cycles to fail (attaining 200 mΩ). The study shows that debris is not deposited at the end of the wear track as in a tin-tin interface. Additionally, once the contact resistance attains high values, the polymer-tin interface recovers to low values. The elastic contact is proposed as an advantageous characteristic of conducting polymers which can be used to eliminate fretting at the contact interface
  • Keywords
    conducting polymers; contact resistance; corrosion; electric connectors; electrical contacts; interface structure; reliability; tin; wear; 200 mohm; Sn; clean tin-tin interface; conducting polymers; contact connector materials; contact interface fretting; contact resistance; contact resistance measurements; contact resistance performance; degradation mechanisms; elastic contact; extrinsic conducting polymer-tin interface; fretting conditions; fretting corrosion; fretting cycles to failure; miniaturisation; polymer-tin interface; surface analysis tools; tin-tin interface; wear track; Conducting materials; Connectors; Contact resistance; Corrosion; Polymers; Strips; Temperature; Testing; Tin; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 2001. Proceedings of the Forty-Seventh IEEE Holm Conference on
  • Conference_Location
    Montreal, Que.
  • Print_ISBN
    0-7803-6667-0
  • Type

    conf

  • DOI
    10.1109/HOLM.2001.953214
  • Filename
    953214