• DocumentCode
    3525057
  • Title

    Data processing in multivariable RFID vapor sensors

  • Author

    Surman, C. ; Pietrzykowski, M. ; Nagraj, N. ; Morris, William ; Sundaresan, A. ; Zhexiong Tang ; Potyrailo, Radislav A.

  • Author_Institution
    GE Global Res., Niskayna, NY, USA
  • fYear
    2011
  • fDate
    7-8 Nov. 2011
  • Firstpage
    28
  • Lastpage
    31
  • Abstract
    Sensors for selective monitoring of gases and volatiles are needed for numerous applications including medical diagnostics, food safety, environmental, industrial, homeland protection, and many others. For these and other applications, we have developed passive radio frequency identification (RFID) sensors for vapor sensing where we apply a sensing film onto the resonant antenna of the RFID sensor, simultaneously measure several parameters of antenna impedance, and process these parameters using multivariate analysis tools. In this work, we critically analyze techniques of processing the impedance response of individual sensors coated with different sensing materials and the ability of these techniques to increase selectivity of developed sensors upon exposure to model vapors. Four types of investigated data processing techniques are based on unsupervised and supervised pattern recognition algorithms. Two evaluation criteria for these techniques involved their ability (1) to correctly identify types of vapors and (2) to provide the smallest error of prediction of concentrations of vapors.
  • Keywords
    gas sensors; pattern recognition; radiofrequency identification; RFID sensor; antenna impedance; data processing technique; multivariable RFID vapor sensors; passive radio frequency identification; resonant antenna; sensing film; unsupervised pattern recognition algorithm; Indium phosphide; Lead; Principal component analysis; Resonant frequency; multivariate data analysis; passive RFID sensors; selectivity; vapor response;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Future of Instrumentation International Workshop (FIIW), 2011
  • Conference_Location
    Oak Ridge, TN
  • Print_ISBN
    978-1-4673-5835-4
  • Type

    conf

  • DOI
    10.1109/FIIW.2011.6476811
  • Filename
    6476811