• DocumentCode
    3525070
  • Title

    The One-per-wafer ZTJ solar cell from Emcore- confidence testing and volume manufacturing performance

  • Author

    Cho, Benjamin ; Winter, Michael ; Aeby, Ian ; Patel, Pravin ; Fatemi, Navid ; Sharps, Paul

  • Author_Institution
    Emcore Photovoltaics, Albuquerque, NM, USA
  • fYear
    2012
  • fDate
    3-8 June 2012
  • Abstract
    The Emcore One-per-wafer ZTJ solar cell, with a cell area of approximately 60cm2, is based on the 29.5% efficiency ZTJ triple-junction structure. The performance of this cell has been enhanced via grid design improvements, resulting in a 0.3% absolute efficiency increase. To confirm electrical performance and investigate reliability with respect to the grid metal and form factor changes implemented in the One-per-wafer ZTJ cell, Emcore has performed a series of confidence tests, which the cells successfully passed. Electrical measurements for approximately 14,000 One-per-wafer ZTJ cells manufactured at Emcore show a median AM0 efficiency of 29.3% (1353 W/m2).
  • Keywords
    reliability; solar cells; Emcore-confidence testing; ZTJ triple-junction structure; efficiency 0.3 percent; efficiency 29.3 percent; efficiency 29.5 percent; electrical measurements; grid design improvements; grid metal; one-per-wafer ZTJ solar cell; reliability; volume manufacturing performance; Frequency modulation; Humidity; Metals; Photovoltaic cells; Standards; Testing; Welding; Aerospace testing; III–V semiconductor materials; photovoltaic cells;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4673-0064-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2012.6318248
  • Filename
    6318248