DocumentCode :
3525206
Title :
A 5MHz low-noise 130nm CMOS analog front-end electronics for the readout of non-linear DEPFET sensor with signal compression for the European XFEL
Author :
De Vita, Giulio ; Bombelli, Luca ; Porro, Matteo ; Herrmann, Sven ; Wassatsch, Andreas ; Facchinetti, Stefano ; Fiorini, Carlo ; Erdinger, Florian
Author_Institution :
Max-Planck Inst. fuer extraterrestrische Phys., Garching, Germany
fYear :
2010
fDate :
Oct. 30 2010-Nov. 6 2010
Firstpage :
139
Lastpage :
144
Abstract :
We present an integrated analog front-end for the readout of a non-linear DEPFET Sensor with Signal Compression (DSSC). The DSSC system, currently under development, is a 1-Mega pixel detector system for the European X-ray Free Electron Laser (XFEL) in Hamburg. It will record X-ray images with a maximum frame rate of 4.5MHz and will achieve at the same time a single photon resolution at 1keV and a high dynamic range. Two different readout strategies of the DEPFET pixel, Source Follower (SF) and Drain Readout (DR), have been fabricated in the 1.2V 0.13μm IBM CMOS technology. Both solutions share the same analog filter based on a new architecture that implements a trapezoidal shaping function employing only one operational amplifier. In this paper, the architecture of the analog front-end relative to both the readout strategies and of the new designed filter and the performance of the test chips are presented.
Keywords :
CMOS analogue integrated circuits; X-ray imaging; X-ray lasers; field effect transistors; filters; free electron lasers; operational amplifiers; readout electronics; European X-ray free electron laser; European XFEL; X-ray images; analog filter; drain readout; frequency 4.5 MHz; low-noise CMOS analog front-end electronics; nonlinear DEPFET sensor; operational amplifier; signal compression; size 0.13 mum; source follower; trapezoidal shaping function; voltage 1.2 V; Current measurement; Dynamic range; Logic gates; Noise; Photonics; Pixel; Semiconductor device measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location :
Knoxville, TN
ISSN :
1095-7863
Print_ISBN :
978-1-4244-9106-3
Type :
conf
DOI :
10.1109/NSSMIC.2010.5873733
Filename :
5873733
Link To Document :
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