DocumentCode
3525206
Title
A 5MHz low-noise 130nm CMOS analog front-end electronics for the readout of non-linear DEPFET sensor with signal compression for the European XFEL
Author
De Vita, Giulio ; Bombelli, Luca ; Porro, Matteo ; Herrmann, Sven ; Wassatsch, Andreas ; Facchinetti, Stefano ; Fiorini, Carlo ; Erdinger, Florian
Author_Institution
Max-Planck Inst. fuer extraterrestrische Phys., Garching, Germany
fYear
2010
fDate
Oct. 30 2010-Nov. 6 2010
Firstpage
139
Lastpage
144
Abstract
We present an integrated analog front-end for the readout of a non-linear DEPFET Sensor with Signal Compression (DSSC). The DSSC system, currently under development, is a 1-Mega pixel detector system for the European X-ray Free Electron Laser (XFEL) in Hamburg. It will record X-ray images with a maximum frame rate of 4.5MHz and will achieve at the same time a single photon resolution at 1keV and a high dynamic range. Two different readout strategies of the DEPFET pixel, Source Follower (SF) and Drain Readout (DR), have been fabricated in the 1.2V 0.13μm IBM CMOS technology. Both solutions share the same analog filter based on a new architecture that implements a trapezoidal shaping function employing only one operational amplifier. In this paper, the architecture of the analog front-end relative to both the readout strategies and of the new designed filter and the performance of the test chips are presented.
Keywords
CMOS analogue integrated circuits; X-ray imaging; X-ray lasers; field effect transistors; filters; free electron lasers; operational amplifiers; readout electronics; European X-ray free electron laser; European XFEL; X-ray images; analog filter; drain readout; frequency 4.5 MHz; low-noise CMOS analog front-end electronics; nonlinear DEPFET sensor; operational amplifier; signal compression; size 0.13 mum; source follower; trapezoidal shaping function; voltage 1.2 V; Current measurement; Dynamic range; Logic gates; Noise; Photonics; Pixel; Semiconductor device measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location
Knoxville, TN
ISSN
1095-7863
Print_ISBN
978-1-4244-9106-3
Type
conf
DOI
10.1109/NSSMIC.2010.5873733
Filename
5873733
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