• DocumentCode
    3525252
  • Title

    Mechanism analysis on hydrophobicity decrease of operating silicone rubber insulators

  • Author

    Huang, Xingquan ; Zhao, Linjie ; Li, Chengrong ; Zhang, Shuqi ; Yao, Jisha ; Xiong, Jun ; Song, Wei

  • Author_Institution
    Henan Electr. Power Res. Inst., Zhenszhou
  • fYear
    2006
  • fDate
    15-18 Oct. 2006
  • Firstpage
    377
  • Lastpage
    380
  • Abstract
    Through a series of on-site hydrophobicity-measuring tests for the silicone rubber insulators operated in Henan electric power grid of China, some insulators were found having the bad hydrophobicity performance. The objective of this paper is focused on the mechanism analysis of the hydrophobicity decrease of these insulators through a series of laboratory tests. As a comparison, some new samples were also investigated. Firstly, the hydrophobicity of the tested insulators was measured using the HC method before and after washing the contamination layer away. In addition, the scanning electron microscopy (SEM) and the attenuated total reflection infrared spectroscopy (ATR-FTIR) were also used to analyze the effect of aging on the hydrophobicity of the operating insulators. The test results show that the difference of the hydrophobicity performance of silicone rubber materials between the operated insulators and the new ones is negligible. The contamination deposition is the main factors causing the surface hydrophobicity decrease of these operating insulators. Some aging phenomena were found through SEM and ATR-FTIR tests. But the relationship between these aging phenomena and the hydrophocity decrease of the operated insulators was not found.
  • Keywords
    Fourier transform spectra; ageing; attenuated total reflection; infrared spectra; polymers; scanning electron microscopy; silicone rubber insulators; ATR-FTIR analysis; China; Henan electric power grid; SEM analysis; aging; attenuated total reflection infrared spectroscopy; hydrophobicity; scanning electron microscopy; silicone rubber insulators; Aging; Contamination; Dielectrics and electrical insulation; Insulator testing; Laboratories; Pollution measurement; Power systems; Reflection; Rubber; Scanning electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2006 IEEE Conference on
  • Conference_Location
    Kansas City, MO
  • Print_ISBN
    1-4244-0546-7
  • Electronic_ISBN
    1-4244-0547-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.2006.311948
  • Filename
    4105449