Title :
Small-signal measurement of laser diode chips
Author :
Liu, Yu ; Zhu, Ning Hua ; Pun, Edwin Y B ; Chung, P.S.
Author_Institution :
Inst. of Semicond., Acad. Sinica, Beijing, China
Abstract :
Presents an accurate technique for measuring the input reflection coefficient and the frequency response of semiconductor laser diode chips. The effects of packaging parasitics and test probes can be completely removed in the measurement.
Keywords :
calibration; frequency response; laser beams; laser variables measurement; light reflection; semiconductor device packaging; semiconductor lasers; frequency response; input reflection coefficient; laser diode chips; packaging parasitics; semiconductor laser diode chips; small-signal measurement; test probes; Bonding; Diode lasers; Electrical resistance measurement; Fixtures; Impedance measurement; Optical reflection; Probes; Semiconductor device measurement; Testing; Wire;
Conference_Titel :
Communications, 1999. APCC/OECC '99. Fifth Asia-Pacific Conference on ... and Fourth Optoelectronics and Communications Conference
Conference_Location :
Beijing, China
Print_ISBN :
7-5635-0402-8
DOI :
10.1109/APCC.1999.820537
