• DocumentCode
    352552
  • Title

    An interpretation of altimeter measurements from ocean

  • Author

    Fung, Adrian K. ; Zuffada, Cinzia

  • Author_Institution
    Dept. of Electr. Eng., Texas Univ., Arlington, TX, USA
  • Volume
    6
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    2555
  • Abstract
    In ocean surface scattering many investigators believe that only a certain portion of the sea spectrum is responsible for scattering along a given direction of interest. This is based on the fact that different roughness scales dominate scattering in different directions. As a result when the direction of observation is known, only a certain portion of the surface spectrum is selected for use in a scattering model calculation. For altimeter observations some investigators have excluded the high frequency portion of the sea spectrum in their model calculations leading to effective rather than real parameters in their models. The present authors show an alternative modeling approach where the use of the complete sea spectrum can lead to scattering coefficient estimates in agreement with the TOPEX and other altimeter measurements without resorting to effective model parameters. Furthermore, they demonstrate that there is consistency between the surface slopes derived from this scattering model based on microwave data and optically measured surface slopes
  • Keywords
    backscatter; ocean waves; oceanographic techniques; radar cross-sections; radar theory; remote sensing by radar; spaceborne radar; backscatter; complete sea spectrum; direction; dynamics; measurement technique; model calculation; ocean wave; radar altimetry method; radar remote sensing; radar scattering; roughness; scattering coefficient; sea surface slope; surface scattering; Large-scale systems; Oceans; Optical scattering; Optical surface waves; Radar scattering; Rough surfaces; Sea measurements; Sea surface; Surface roughness; Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    0-7803-6359-0
  • Type

    conf

  • DOI
    10.1109/IGARSS.2000.859638
  • Filename
    859638