Title :
Statistical testing of the form of the Mueller matrix of terrain at millimeter wavelengths
Author :
Munn, Jiyoun ; De Roo, Roger D. ; Ulaby, Fawwaz T.
Author_Institution :
Michigan Univ., Ann Arbor, MI, USA
Abstract :
A number of target symmetries, such as azimuthal symmetry for natural terrain, have a consequence on the form of the Mueller matrix. If these symmetries are found to be plausible, it can greatly assist in the modeling of the polarimetric response from the class of targets that exhibit such symmetry. By applying the test to large numbers of measured covariance matrices organized by terrain class (i.e. tree canopies, dry snow near grazing, etc.), the plausibility of various forms of the covariance matrix is explored. An example of symmetry which gives rise to a form of the covariance matrix is the hypothesis that co-polarized backscatter can be dominated by single scattering, while cross-polarized backscatter is multiple scattering. This results in the coherence between co- and cross-polarized radar backscatter being zero. This hypothesis is put to the complex R2 test for W-band backscattering from snow
Keywords :
S-matrix theory; backscatter; covariance matrices; geophysical techniques; hydrological techniques; radar cross-sections; radar polarimetry; radar theory; remote sensing by radar; snow; terrain mapping; vegetation mapping; EHF; Mueller matrix; W-band; azimuthal symmetry; backscatter; backscattering; coherence; covariance matrices; covariance matrix; geophysical measurement technique; hydrology; land surface; millimeter wavelength; millimetre wave radar; mm wave; model; multiple scattering; polarimetric response; radar polarimetry; radar remote sensing; radar scattering; snow cover; snowcover; statistical testing; terrain mapping; tree canopy; vegetation mapping; Backscatter; Clutter; Covariance matrix; Millimeter wave measurements; Millimeter wave radar; Polarization; Radar scattering; Snow; Statistical analysis; Testing;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International
Conference_Location :
Honolulu, HI
Print_ISBN :
0-7803-6359-0
DOI :
10.1109/IGARSS.2000.859642