Title :
The electron field emission from the Si nanostructures formed by laser irradiation
Author :
Evtukh, A. ; Medvid, A. ; Onufrijevs, P. ; Mimura, H.
Author_Institution :
Inst. of Semicond. Phys., NASU, Kiev, Ukraine
Abstract :
Silicon electron field emitters may be attractive for numerous applications, mostly due to their compatibility with the dominating Si-based solid state microand nanoelectronics. The technology of nanostructure formation through a laser radiation (LR) on Si surface for the electron field emitter is proposed. N-type Si wafers are used in the experiments. The experiments were performed in an ambient atmosphere at 1 atm. pressure, at a room temperature T=20degC with a humidity of 80%. Radiation from a pulsed Nd:YAG laser second harmonica (pulse duration 10 ns; wavelength 532 nm; power 1MW) was normally directed at the Si surface. The spot of a laser beam of 3 mm in diameter was scanned over the sample surface. In the experiment Electronic scanning microscope, Atomic force microscope and Electronic field emission facility were used. In this particular experiment nanometer size cone-like nanostructures were created on the surface as a result of laser irradiation. Cone-like structures with nanosphere on top of the cone formed after the irradiation by the laser. A decrease in the nanosphere diameter from 600 nm to20 nn with an increase of intensity of LP from 2.0MW/cm2 to 20.0 MW/cm2 was observed.
Keywords :
atomic force microscopy; electron field emission; elemental semiconductors; laser beam effects; nanoelectronics; nanostructured materials; scanning electron microscopy; silicon; Si; atomic force microscope; cone-like structures; electron field emission; electronic scanning microscope; laser irradiation; nanoelectronics; pressure 1 atm; pulsed Nd:YAG laser second harmonica; silicon nanostructures; temperature 20 C; Atmosphere; Atomic force microscopy; Electron emission; Nanoelectronics; Nanostructures; Optical pulses; Scanning electron microscopy; Silicon; Solid state circuits; Surface emitting lasers;
Conference_Titel :
Vacuum Nanoelectronics Conference, 2009. IVNC 2009. 22nd International
Conference_Location :
Shizuoka
Print_ISBN :
978-1-4244-3587-6
Electronic_ISBN :
978-1-4244-3588-3
DOI :
10.1109/IVNC.2009.5271560