Development of color laue method using the counting-type pixel detector PILATUS

Author

Toyokawa, Hidenori ; Kajiwara, Kentaro ; Sato, Masugu

Author_Institution

Controls & Comput. Div., Japan Synchrotron Radiat. Res. Inst., Sayo, Japan

fYear

2010

fDate

Oct. 30 2010-Nov. 6 2010

Firstpage

333

Lastpage

335

Abstract

We have developed a precise energy-resolved X-ray imaging method using the counting-type pixel detector, PILATUS. X-ray intensities were recorded as a scan of the threshold energies and its energy was determined with the s-curve fitting analysis. Laue diffraction patterns of a silicon steel sample were measured with white X-ray beams at BL28B2 of SPring-8. A grain image of silicon steel was obtained with a sample position scan. The reflected X-ray energies were determined at three sample positions to analyze the lattice constant in the sample crystal grain.

Keywords

X-ray crystallography; X-ray imaging; lattice constants; semiconductor counters; BL28B2; Laue diffraction patterns; PILATUS; SPring-8; X-ray intensities; color Laue method; counting-type pixel detector; energy-resolved X-ray imaging method; grain image; lattice constant; reflected X-ray energies; s-curve fitting analysis; sample crystal grain; silicon steel sample; threshold energies; white X-ray beams; Detectors; Diffraction; Pixel; Silicon; Synchrotron radiation; X-ray diffraction; X-ray imaging;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE

Conference_Location

Knoxville, TN

ISSN

1095-7863

Print_ISBN

978-1-4244-9106-3

Type

conf

DOI

10.1109/NSSMIC.2010.5873775

Filename

5873775