DocumentCode
3526078
Title
Development of dry-processed silicon nano-dot planar cold cathode and its electron emission properties
Author
Hirano, Yoshiyuki ; Nanba, Masakazu ; Egami, Norifumi ; Yamazaki, Susumu ; Koshida, Nobuyoshi
Author_Institution
NHK Sci. & Tech. Res. Labs., Tokyo, Japan
fYear
2009
fDate
20-24 July 2009
Firstpage
133
Lastpage
134
Abstract
Planar-type porous silicon cold cathodes have some specific properties: the emission of energetic electrons with small angle dispersion and the availability for various media including solutions. The nanocrystalline silicon dot chain incorporated into porous silicon plays an important role as a drift layer generating quasi-ballistic electrons. The porous silicon drift layer is usually formed using wet processing: anodization of singleor polycrystalline silicon in HF solutions. Employment of dry-processing for fabricating Si-nanodot film would make it easier to integrate the emitter array into its driving circuit. In this work, we have developed dry-processed planar-type cold cathodes in which a multilayered Si-nanodots film acts as the drift layer and investigated the relationship between the multilayered Si-nanodots structure and the electron emission characteristics.
Keywords
anodisation; cathodes; electron emission; elemental semiconductors; multilayers; nanostructured materials; porous semiconductors; semiconductor quantum dots; silicon; HF solutions; Si; anodization; dry processing; dry-processed silicon nanodot; electron emission properties; nanocrystalline silicon dot chain; planar-type porous silicon cold cathodes; porous silicon drift layer; quasi-ballistic electrons; small angle dispersion; wet processing; Cathodes; Diodes; Electrodes; Electron emission; Laboratories; Oxidation; Semiconductor films; Silicon; Tunneling; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Nanoelectronics Conference, 2009. IVNC 2009. 22nd International
Conference_Location
Shizuoka
Print_ISBN
978-1-4244-3587-6
Electronic_ISBN
978-1-4244-3588-3
Type
conf
DOI
10.1109/IVNC.2009.5271573
Filename
5271573
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