• DocumentCode
    3526078
  • Title

    Development of dry-processed silicon nano-dot planar cold cathode and its electron emission properties

  • Author

    Hirano, Yoshiyuki ; Nanba, Masakazu ; Egami, Norifumi ; Yamazaki, Susumu ; Koshida, Nobuyoshi

  • Author_Institution
    NHK Sci. & Tech. Res. Labs., Tokyo, Japan
  • fYear
    2009
  • fDate
    20-24 July 2009
  • Firstpage
    133
  • Lastpage
    134
  • Abstract
    Planar-type porous silicon cold cathodes have some specific properties: the emission of energetic electrons with small angle dispersion and the availability for various media including solutions. The nanocrystalline silicon dot chain incorporated into porous silicon plays an important role as a drift layer generating quasi-ballistic electrons. The porous silicon drift layer is usually formed using wet processing: anodization of singleor polycrystalline silicon in HF solutions. Employment of dry-processing for fabricating Si-nanodot film would make it easier to integrate the emitter array into its driving circuit. In this work, we have developed dry-processed planar-type cold cathodes in which a multilayered Si-nanodots film acts as the drift layer and investigated the relationship between the multilayered Si-nanodots structure and the electron emission characteristics.
  • Keywords
    anodisation; cathodes; electron emission; elemental semiconductors; multilayers; nanostructured materials; porous semiconductors; semiconductor quantum dots; silicon; HF solutions; Si; anodization; dry processing; dry-processed silicon nanodot; electron emission properties; nanocrystalline silicon dot chain; planar-type porous silicon cold cathodes; porous silicon drift layer; quasi-ballistic electrons; small angle dispersion; wet processing; Cathodes; Diodes; Electrodes; Electron emission; Laboratories; Oxidation; Semiconductor films; Silicon; Tunneling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2009. IVNC 2009. 22nd International
  • Conference_Location
    Shizuoka
  • Print_ISBN
    978-1-4244-3587-6
  • Electronic_ISBN
    978-1-4244-3588-3
  • Type

    conf

  • DOI
    10.1109/IVNC.2009.5271573
  • Filename
    5271573