• DocumentCode
    3526099
  • Title

    The work function of W(100) surface with yttrium oxide modification measured by the onset energy profiling of the secondary electrons and by the photoemission measurement with the photoelectron emission microscope

  • Author

    Kawakubo, Takashi ; Kitaguchi, Tatsuya ; Nakane, Hideaki

  • Author_Institution
    Dept. of Telecommun., Takuma Nat. Coll. of Technol., Mitoyo, Japan
  • fYear
    2009
  • fDate
    20-24 July 2009
  • Firstpage
    127
  • Lastpage
    128
  • Abstract
    In this study, we report that the estimations of the work function of Y-oxide/W(100) surface by measuring the onset energy of the secondary electrons using the retarding method and by measuring the photoemission using photoelectron emission microscope (PEEM). The onset energy is shifted when the work function of the sample is changed. Thus the work function of the sample can be estimated from the difference between the standard sample which the work function is well known and the sample to be measured. In this experiment, low energy electron diffraction (LEED) optics is used for the measurement setup. The PEEM method is used of photoelectric effect which the photoelectrons are emitted from the sample surface due to the incident of the light on the sample surface. The work function is estimated by the relation between the wave length of the light and the photoelectron current density.
  • Keywords
    current density; low energy electron diffraction; photoelectron spectra; tungsten; work function; yttrium compounds; LEED; PEEM; Y-oxide-W(100) surface; Y2O3-W; current density; light wavelength; low energy electron diffraction; onset energy profiling; photoelectric effect; photoelectron emission microscopy; photoemission; retarding method; secondary electrons; work function; Electron emission; Electron microscopy; Electron optics; Energy measurement; Measurement standards; Optical diffraction; Optical surface waves; Photoelectricity; Photoelectron microscopy; Yttrium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2009. IVNC 2009. 22nd International
  • Conference_Location
    Shizuoka
  • Print_ISBN
    978-1-4244-3587-6
  • Electronic_ISBN
    978-1-4244-3588-3
  • Type

    conf

  • DOI
    10.1109/IVNC.2009.5271574
  • Filename
    5271574