Detour trajectory of field electrons from the triple junction

Author

Chung, M.S. ; Yoon, B.G. ; Mayer, A. ; Weiss, B.L. ; Miskovsky, N.M. ; Cutler, P.H.

Author_Institution

Dept. of Phys., Univ. of Ulsan, Ulsan, South Korea

fYear

2009

fDate

20-24 July 2009

Firstpage

217

Lastpage

218

Abstract

We have theoretically investigated the field emission from the metal-dielectric-vacuum junction. To understand the observed enhanced field emission, we have made attempts to describe both the enhancement of the electric field and the trajectory of field electrons. According to the recent studies, the field enhancement is found to be due to the combined effect of the surface charge of metal and the polarization of dielectric. The angle ratio of dielectric to vacuum is found to be the key factor in determining whether the field enhances or reduces.

Keywords

dielectric polarisation; electron field emission; metal-insulator boundaries; detour trajectory; dielectric angle; dielectric polarization; electric field enhancement; field electron emission; field electron trajectory; metal-dielectric-vacuum junction; triple junction; Current density; Dielectric breakdown; Dielectric constant; Electron emission; Physics; Polarization; Potential energy; Space charge; Tunneling; Vacuum breakdown;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Nanoelectronics Conference, 2009. IVNC 2009. 22nd International

Conference_Location

Shizuoka

Print_ISBN

978-1-4244-3587-6

Electronic_ISBN

978-1-4244-3588-3

Type

conf

DOI

10.1109/IVNC.2009.5271580

Filename

5271580