DocumentCode
3526227
Title
R&M through avionics/electronics integrity program
Author
Bhagat, Wilbur W.
Author_Institution
Wright-Patterson AFB, OH, USA
fYear
1989
fDate
24-26 Jan 1989
Firstpage
216
Lastpage
220
Abstract
Addresses the importance of designing reliability and maintainability (R&M) into electronic equipment in the early stages of its development. The author describes an approach called the avionics/electronics integrity program (AVIP), which emphasizes early attention to design criteria and analysis, and dictates a process which strikes a balance between analysis and test. He outlines some of the problems and limitations that have been observed using the traditional reliability approach (MIL-STD-785 process) and discusses how the AVIP approach will overcome these problems and limitations. AVIP retains and incorporates the proven and useful elements of the traditional reliability approach, such as failure modes; effects and criticality analysis (FMECA); failure reporting analysis and corrective action system (FRACAS); and environmental stress screening (ESS)
Keywords
aircraft instrumentation; maintenance engineering; military systems; reliability; (ESS); (FRACAS); AVIP; MIL-STD-785 process; avionics/electronics integrity program; corrective action system; criticality analysis; design criteria; environmental stress screening; failure modes; failure reporting analysis; maintainability; reliability; Aerospace electronics; Costs; Fatigue; Maintenance; Redundancy; Resists; Safety; Testing; Thermal degradation; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 1989. Proceedings., Annual
Conference_Location
Atlanta, GA
Type
conf
DOI
10.1109/ARMS.1989.49604
Filename
49604
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