• DocumentCode
    3526227
  • Title

    R&M through avionics/electronics integrity program

  • Author

    Bhagat, Wilbur W.

  • Author_Institution
    Wright-Patterson AFB, OH, USA
  • fYear
    1989
  • fDate
    24-26 Jan 1989
  • Firstpage
    216
  • Lastpage
    220
  • Abstract
    Addresses the importance of designing reliability and maintainability (R&M) into electronic equipment in the early stages of its development. The author describes an approach called the avionics/electronics integrity program (AVIP), which emphasizes early attention to design criteria and analysis, and dictates a process which strikes a balance between analysis and test. He outlines some of the problems and limitations that have been observed using the traditional reliability approach (MIL-STD-785 process) and discusses how the AVIP approach will overcome these problems and limitations. AVIP retains and incorporates the proven and useful elements of the traditional reliability approach, such as failure modes; effects and criticality analysis (FMECA); failure reporting analysis and corrective action system (FRACAS); and environmental stress screening (ESS)
  • Keywords
    aircraft instrumentation; maintenance engineering; military systems; reliability; (ESS); (FRACAS); AVIP; MIL-STD-785 process; avionics/electronics integrity program; corrective action system; criticality analysis; design criteria; environmental stress screening; failure modes; failure reporting analysis; maintainability; reliability; Aerospace electronics; Costs; Fatigue; Maintenance; Redundancy; Resists; Safety; Testing; Thermal degradation; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 1989. Proceedings., Annual
  • Conference_Location
    Atlanta, GA
  • Type

    conf

  • DOI
    10.1109/ARMS.1989.49604
  • Filename
    49604