DocumentCode :
3526308
Title :
STiC — An ASIC CHIP for Silicon-photomultiplier fast timing discrimination
Author :
Shen, Wei ; Harion, Tobias ; Schultz-Coulon, H.-C.
Author_Institution :
Kirchho.ff Insitut fur Phys., Univ. Heidelberg, Heidelberg, Germany
fYear :
2010
fDate :
Oct. 30 2010-Nov. 6 2010
Firstpage :
406
Lastpage :
408
Abstract :
STiC-Silicon Photomultipler (SiPM) Timing Chip, is a prtotype ASIC with 4 channels dedicated to fast timing discrimination in Positron Emmission Tomography using SiPM. It is designed in AMS 0.35μm CMOS technology. Each single channel of the chip can be operated either in constant fraction (CF) or leading edge (LE) triggering mode. The basic principle of the SiPM readout is to sink the current signal into a low impedance current buffer and duplicate the current into two processing paths for later current discrimination. One of the two paths is used for low threshold triggering, which can be applied as LE triggering as well as a Time over Threshold (ToT, with a roughly higher threshold) for energy measurement. The other path passes the signal into a current high pass filter to generate the bipolar pulse for CF timing. Since the input stage of the filter is implemented by an integral capacitor. Measuring the voltage at this point also gives charge of the signal. The engery resoltion of charge measurement is 11% for a 22Na source. Meawhile 20% resolution is also accomplished using ToT methode. The coincidence timing is 479ps and 712ps (FWHM) repectively for LE and CF. The results of both timing methods are compared and discussed.
Keywords :
CMOS integrated circuits; application specific integrated circuits; electric current measurement; nuclear electronics; photomultipliers; positron emission tomography; readout electronics; silicon radiation detectors; 22Na source; ASIC CHIP; CMOS technology; bipolar pulse; charge measurement; current high pass filter; leading edge triggering mode; low impedance current buffer; low threshold triggering mode; positron emmission tomography; silicon photomultipler readout system; silicon photomultipler timing chip; silicon-photomultiplier fast timing discrimination; timing method; voltage measurement; Calibration; Charge measurement; Current measurement; Detectors; Jitter; Positron emission tomography; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location :
Knoxville, TN
ISSN :
1095-7863
Print_ISBN :
978-1-4244-9106-3
Type :
conf
DOI :
10.1109/NSSMIC.2010.5873790
Filename :
5873790
Link To Document :
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