• DocumentCode
    3526308
  • Title

    STiC — An ASIC CHIP for Silicon-photomultiplier fast timing discrimination

  • Author

    Shen, Wei ; Harion, Tobias ; Schultz-Coulon, H.-C.

  • Author_Institution
    Kirchho.ff Insitut fur Phys., Univ. Heidelberg, Heidelberg, Germany
  • fYear
    2010
  • fDate
    Oct. 30 2010-Nov. 6 2010
  • Firstpage
    406
  • Lastpage
    408
  • Abstract
    STiC-Silicon Photomultipler (SiPM) Timing Chip, is a prtotype ASIC with 4 channels dedicated to fast timing discrimination in Positron Emmission Tomography using SiPM. It is designed in AMS 0.35μm CMOS technology. Each single channel of the chip can be operated either in constant fraction (CF) or leading edge (LE) triggering mode. The basic principle of the SiPM readout is to sink the current signal into a low impedance current buffer and duplicate the current into two processing paths for later current discrimination. One of the two paths is used for low threshold triggering, which can be applied as LE triggering as well as a Time over Threshold (ToT, with a roughly higher threshold) for energy measurement. The other path passes the signal into a current high pass filter to generate the bipolar pulse for CF timing. Since the input stage of the filter is implemented by an integral capacitor. Measuring the voltage at this point also gives charge of the signal. The engery resoltion of charge measurement is 11% for a 22Na source. Meawhile 20% resolution is also accomplished using ToT methode. The coincidence timing is 479ps and 712ps (FWHM) repectively for LE and CF. The results of both timing methods are compared and discussed.
  • Keywords
    CMOS integrated circuits; application specific integrated circuits; electric current measurement; nuclear electronics; photomultipliers; positron emission tomography; readout electronics; silicon radiation detectors; 22Na source; ASIC CHIP; CMOS technology; bipolar pulse; charge measurement; current high pass filter; leading edge triggering mode; low impedance current buffer; low threshold triggering mode; positron emmission tomography; silicon photomultipler readout system; silicon photomultipler timing chip; silicon-photomultiplier fast timing discrimination; timing method; voltage measurement; Calibration; Charge measurement; Current measurement; Detectors; Jitter; Positron emission tomography; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
  • Conference_Location
    Knoxville, TN
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-9106-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2010.5873790
  • Filename
    5873790