In situ transmission-electron-microscope observation of electron-beam-deposited Pt field emitter under field emission and field evaporation

Author

Murakami, K. ; Matsubara, N. ; Ichikawa, S. ; Wakaya, F. ; Takai, M.

Author_Institution

Center for Quantum Sci. & Technol., Osaka Univ., Toyonaka, Japan

fYear

2009

fDate

20-24 July 2009

Firstpage

171

Lastpage

172

Abstract

In this study, the structural changes in the electron beam-deposited Pt field emitter under field emission and field evaporation were investigated by in situ transmission-electron-microscope (TEM) observation. The structure of the Pt field emitter was found to be unchanged under field emission with an emission current of less than 480 nA. On the contrary, the top of the Pt field emitter was found to be sharpened after field evaporation. The Pt nanocrystals were found to move to the Pt tip top after field evaporation. These results indicated the possibility of the improvement of field emission properties by field evaporation.

Keywords

electron field emission; field evaporation; nanostructured materials; platinum; transmission electron microscopy; Pt; TEM; electron-beam-deposited field emitter; field emission; field evaporation; in situ transmission electron microscope; platinum nanocrystals; structural property; Amorphous materials; Annealing; Carbon dioxide; Electron beams; Electron emission; Interference; Nanocrystals; Nanotechnology; Tungsten; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Nanoelectronics Conference, 2009. IVNC 2009. 22nd International

Conference_Location

Shizuoka

Print_ISBN

978-1-4244-3587-6

Electronic_ISBN

978-1-4244-3588-3

Type

conf

DOI

10.1109/IVNC.2009.5271598

Filename

5271598