DocumentCode
3526567
Title
Scanning probe microscopy for testing ultrafast electronics
Author
Hou, A.S. ; Nechay, B.A. ; Ho, F. ; Bloom, D.M.
fYear
1995
fDate
10-14 July 1995
Firstpage
216
Keywords
Atomic force microscopy; Diffraction gratings; Electronic equipment testing; Frequency modulation; Laser beams; Optical microscopy; Resonant frequency; Scanning probe microscopy; Ultrafast electronics; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 1995. Technical Digest. CLEO/Pacific Rim'95., Pacific Rim Conference on
Conference_Location
Chiba, Japan
Print_ISBN
0-7803-2400-5
Type
conf
DOI
10.1109/CLEOPR.1995.527160
Filename
527160
Link To Document