Title :
Material discrimination study of dual-energy imaging using photon counting detector
Author :
Jia, Hao ; Li, Zhang ; Yuxiang, Xing ; Kejun, Kang ; Yongshun, Xiao
Author_Institution :
Dept. of Eng. Phys., Tsinghua Univ., Beijing, China
fDate :
Oct. 30 2010-Nov. 6 2010
Abstract :
Photon counting detectors with electronic spectrum splitting, such as cadmium telluride (CdTe) and cadmium zinc telluride (CZT) detectors have been widely used in x-ray imaging. We research the feasibility of material discrimination using dual energy imaging with CZT photon counting detector. The initial x-ray spectrum is from the X-ray tube with a voltage of 160 kVp, and the x-ray spectrum is calculated by Monte-Carlo method. A linear CZT detector with 32 pixels was used and an experiment with different materials was conducted. For each scanned object, three images under different photon energies are obtained simultaneously. We chose two of them for dual-energy imaging. A method of material discrimination is presented, using transmission data in different energy regions, we can calculate the atomic number of them. The results show its feasibility and possible of material discrimination using this kind of energy resolving detector. Compared with the typical dual-energy imaging system, this method can achieve higher precision. Using dual-energy imaging method, photon counting detectors can be used in explosive detection and luggage screening, which is proved to be effective.
Keywords :
Monte Carlo methods; X-ray imaging; X-ray spectra; X-ray tubes; photodetectors; photon counting; semiconductor counters; CZT photon counting detector; Monte-Carlo method; X-ray imaging; X-ray spectrum; X-ray tube; atomic number; cadmium zinc telluride detector; dual-energy imaging system; electronic spectrum splitting; energy regions; energy resolving detector; explosive detection; linear CZT detector; luggage screening; material discrimination; photon counting detectors; photon energies; transmission data; Aluminum; Detectors; Electron tubes; Imaging; Materials; Photonics; X-ray imaging; Dual-energy radiography; photon counting detector; spectrum estimation; x-ray imaging;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location :
Knoxville, TN
Print_ISBN :
978-1-4244-9106-3
DOI :
10.1109/NSSMIC.2010.5873816