DocumentCode :
3526883
Title :
Antiferromagnetic Mn on Fe(001) studied by spin-polarized scanning tunneling microscopy
Author :
Schlickum, U. ; Janke-Gilman, N. ; Wulfhekel, W. ; Henk, J. ; Bruno, P. ; Kirschner, J.
Author_Institution :
Max Planck Inst. of Microstructure Phys., Halle, Germany
fYear :
2005
fDate :
4-8 April 2005
Firstpage :
63
Lastpage :
64
Abstract :
In this paper, a detailed analysis of the spin polarization of the surface of thin antiferromagnetic Mn films on Fe(001) is presented. Spin-polarized scanning tunneling microscopy (STM) measurements allows the study of the spin dependent tunneling current through a well defined barrier, a vacuum gap, as a function of the bias voltage. This offers the possibility to study magneto-transport phenomena at antiferromagnetic films in direct contact to a ferromagnet. Bias-dependent measurements performed at the Mn films on Fe(001) show a rather complex behavior of the spin contrast as function of the bias voltage. These experimental observations can be explained with model calculations based on ab-initio band structures. Based on the calculations, the spin contrast at the Mn surfaces can solely be explained by bulk states and no surface states are necessary.
Keywords :
ab initio calculations; antiferromagnetic materials; electron spin polarisation; magnetic thin films; magnetic tunnelling; manganese; scanning tunnelling microscopy; Fe; Mn-Fe; ab-initio band structure; antiferromagnetic film surface; bias voltage; bulk states; magneto-transport phenomena; spin contrast; spin dependent tunneling current; spin polarized scanning tunneling microscopy; vacuum gap; Antiferromagnetic materials; Atomic layer deposition; Iron; Magnetic films; Magnetic separation; Magnetic tunneling; Magnetization; Microscopy; Substrates; Surface topography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
Type :
conf
DOI :
10.1109/INTMAG.2005.1463460
Filename :
1463460
Link To Document :
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