DocumentCode
3526891
Title
Robust high current density cathode using active complex electroplating.
Author
Kim, Wal-Jun ; Lee, Seung-Min ; Jang, Eui-Yun ; Kim, Yong-Hyup
Author_Institution
Sch. of Mech. & Aerosp. Eng., Seoul Nat. Univ., Seoul, South Korea
fYear
2009
fDate
20-24 July 2009
Firstpage
155
Lastpage
156
Abstract
Summary form only given. Carbon nanotubes (CNTs) are candidate for ideal electron field emitters due to their high aspect ratio, superior electrical and thermal conductivity, and relatively high chemical and mechanical stability. Recently, they have been extensively used for high current density emitters of X-ray tubes and THz imaging source to overcome the limitation of thermionic emitters such as high power consumption, lower brightness/resolution, complex additional facilities and short operating time. CNTs cathodes have been a subjected of studies for over a decade and are relatively easy to be made either by chemical vapor deposition in situ growth or by post-growth transfer onto a substrate. However, these methods have not been employed in practical devices because of expensive equipments. They could not be sufficiently satisfied with mass product. In this article, we will focus on a simple fabrication technique for high current density emitters without complex equipments. Figure 1 shows the detailed process and the shape of self-assembled composite emitter by capillary force and pulling-out effect. We can fabricate a high current density emitter from the colloidal solution, dispersing CNTs and dissolving Na2WO4middot2H2O in DMF solvent. Tungsten rod (0.3 mm diameter) was prepared. Electrochemically etched tungsten tip was immersed in the colloidal solution until the solution in the vicinity of tip was stable. Then the tungsten tip was pulled out with the constant speed and DC voltage was simultaneously applied between tungsten tip and colloidal solution. This technique is called active complex electroplating (ACE). The ACE is able to synthesize composite emitters, consists of CNTs and tungsten oxide, on the apex of tungsten tip. The concentration of CNT, withdrawing speed and DC voltage play a role in controlling the diameter and length of the composite emitters. In figure 2, field emission characteristics of 20 um-diamater co- mposite emitter were investigated with respect to current density and emission stability. The maximum current density of annealed emitter was achieved to withstand continuously emission for 24 hours in the order of 380 A/cm2 compared with the pristine emitter. The composite emitter fabricated by ACE will be great promise candidate for robust high current emitter of high-resolution X-ray and THz imaging source.
Keywords
annealing; carbon nanotubes; cathodes; colloids; composite materials; dissolving; electron field emission; electroplating; self-assembly; vacuum microelectronics; C; DMF solvent; THz imaging source; active complex electroplating; annealing; capillary force; carbon nanotubes; cathode; colloidal solution; dissolving; electrochemically etched tungsten tip; emission stability; field emission characteristics; high-current density emitters; high-resolution X-ray source; pulling-out effect; self-assembled composite emitter; size 0.3 mm; size 20 mum; time 24 h; tungsten oxide; tungsten rod; Carbon nanotubes; Cathodes; Current density; Electron emission; High-resolution imaging; Optical imaging; Robustness; Thermal conductivity; Tungsten; X-ray imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Nanoelectronics Conference, 2009. IVNC 2009. 22nd International
Conference_Location
Shizuoka
Print_ISBN
978-1-4244-3587-6
Electronic_ISBN
978-1-4244-3588-3
Type
conf
DOI
10.1109/IVNC.2009.5271614
Filename
5271614
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