DocumentCode :
3526904
Title :
Field emission properties of ZnO nanorods grown on various substrates
Author :
Park, Eunkyung ; Lee, Jungwoo ; Lee, Donghwan ; Lee, Jongtaek ; Yi, Whikun
Author_Institution :
Dept. of Chem., Hanyang Univ., Seoul, South Korea
fYear :
2009
fDate :
20-24 July 2009
Firstpage :
149
Lastpage :
150
Abstract :
In this paper, ZnO nanorods were synthesized by the hydrothermal process on various substrates such as glass, ITO, p-type porous silicon and n-type porous silicon by dipping in ZnO solution and atomic layer deposition method. The thin films a grown on substrates were washed with deionized water to eliminate residual salts, dried in air, and annealed at 400 degC. Scanning electron microscopy and X-ray diffraction showed their structure and morphology. Field emission properties of the ZnO nanorods were measured in vacuum chamber. .
Keywords :
II-VI semiconductors; X-ray diffraction; annealing; atomic layer deposition; crystal growth from solution; elemental semiconductors; field emission; glass; indium compounds; nanofabrication; nanostructured materials; porous semiconductors; scanning electron microscopy; silicon; surface morphology; wide band gap semiconductors; zinc compounds; ITO; Si; X-ray diffraction; ZnO; annealing; atomic layer deposition method; deionized water; dipping; field emission properties; glass substrates; hydrothermal process; n-type porous semiconductor; p-type porous semiconductor; scanning electron microscopy; semiconducting nanorods; surface morphology; temperature 400 C; vacuum chamber; Annealing; Atomic layer deposition; Glass; Indium tin oxide; Morphology; Scanning electron microscopy; Silicon; Transistors; X-ray diffraction; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference, 2009. IVNC 2009. 22nd International
Conference_Location :
Shizuoka
Print_ISBN :
978-1-4244-3587-6
Electronic_ISBN :
978-1-4244-3588-3
Type :
conf
DOI :
10.1109/IVNC.2009.5271615
Filename :
5271615
Link To Document :
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