Magnetization relaxation in sputtered thin Fe films: evidence of spin-pumping effect

Author

Kuanr, Bijoy K. ; Kuanr, A.V. ; Camley, R.E. ; Celinzki, Z.

Author_Institution

Dept. of Phys., Colorado Univ., Colorado Springs, CO, USA

fYear

2005

fDate

4-8 April 2005

Firstpage

73

Lastpage

74

Abstract

Polycrystalline Fe films were grown by magnetron sputtering on GaAs(100) substrates with a background pressure ∼10^-7 Torr. The ferromagnetic resonance linewidth (FMR) of these thin Fe films in NM/Fe/NM structure (NM=Cu, Ti) was investigated to clarify the effect of spin transport on Gilbert damping. In Ti/Fe/Ti structure, Ti film is found to act as a good spin sink. This explains the large magnetization damping observed in the Ti/Fe/Ti structure.

Keywords

copper; ferromagnetic materials; ferromagnetic relaxation; ferromagnetic resonance; iron; magnetic multilayers; magnetic thin films; magnetisation; metallic thin films; spin polarised transport; sputter deposition; titanium; 1E-7 torr; Cu-Fe-Cu; GaAs; Gilbert damping; Ti-Fe-Ti; ferromagnetic resonance linewidth; magnetization damping; magnetization relaxation; magnetron sputtering; polycrystalline films; spin sink; spin transport; spin-pumping effect; sputtered thin films; Damping; Educational institutions; Gallium arsenide; Iron; Magnetic films; Magnetic resonance; Magnetization; Scattering; Substrates; Transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International

Print_ISBN

0-7803-9009-1

Type

conf

DOI

10.1109/INTMAG.2005.1463465

Filename

1463465