Title :
A serializer ASIC for high speed data transmission in cryogenic and HiRel environment
Author_Institution :
Southern Methodist Univ., Dallas, TX, USA
fDate :
Oct. 30 2010-Nov. 6 2010
Abstract :
A high speed 16:1 serializer ASIC has been developed using a commercial 0.25 μm silicon-on-sapphire CMOS technology. At room temperature the ASIC operates from 4.0 to 5.7 Gbps with power consumption of 463 mW. The total jitter is 62 ps at the bit error rate of 10-12 at 5 Gbps. A 200-MeV proton beam test indicates that the ASIC is suitable for high energy physics applications. A liquid nitrogen temperature test indicates that the ASIC may be used at cryogenic temperature applications. The reliability of the serializer at liquid nitrogen temperature is to be studied. A 6-lane serializer array with 10 Gbps/lane with redundancy capability is under development.
Keywords :
CMOS logic circuits; application specific integrated circuits; cryogenic electronics; data communication; logic arrays; nuclear electronics; silicon radiation detectors; silicon-on-insulator; timing jitter; 6-lane serializer array; HiRel environment; bit error rate; bit rate 40 Gbit/s to 5.7 Gbit/s; cryogenic temperature applications; electron volt energy 200 MeV; high energy physics applications; high speed data transmission; high speed serializer ASIC; jitter; liquid nitrogen temperature test; power 463 mW; power consumption; proton beam test; redundancy capability; silicon-on-sapphire CMOS technology; size 0.25 mum; temperature 293 K to 298 K; Application specific integrated circuits; Arrays; Bit error rate; Clocks; Cryogenics; Jitter; Optical fiber communication;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location :
Knoxville, TN
Print_ISBN :
978-1-4244-9106-3
DOI :
10.1109/NSSMIC.2010.5873837
