Title :
Graphene field effect transistors for detection of ionizing radiation
Author :
Patil, Amol ; Lopez, Gabriel ; Foxe, Michael ; Childres, Isaac ; Roecker, Caleb ; Boguski, John ; Jovanovic, Igor ; Chen, Yong P.
Author_Institution :
Dept. of Phys., Purdue Univ., West Lafayette, IN, USA
fDate :
Oct. 30 2010-Nov. 6 2010
Abstract :
A novel radiation detector based on a graphene field effect transistor (GFET) is experimentally demonstrated. The detection in GFET relies on the high sensitivity of the resistivity of graphene to the local change of electric field that can result from ionized charges produced in the underlying semiconductor substrate. We present the experimental results of our study on the graphene-based radiation detector response to X-rays. We observed increasing resistance change of graphene with increasing X-ray flux in an electrically biased GFET based on a Si substrate. We have measured the temporal characteristics of our detector, along with the sensitivity of the device at high (40 kV-80 μA) and low (15 kV-15 μA) X-ray fluxes. Furthermore, we demonstrate room-temperature operation of a graphene radiation sensor based on a SiC absorber.
Keywords :
X-ray detection; electrical resistivity; field effect transistors; fullerene devices; graphene; nuclear electronics; silicon radiation detectors; C; SiC absorber; X-ray flux; current 15 muA; current 80 muA; detector temporal characteristics; graphene field effect transistor; graphene radiation sensor; graphene-based radiation detector; ionizing charge production; ionizing radiation detection; resistivity analysis; voltage 15 kV; voltage 40 kV; Detectors; Electrical resistance measurement; Resistance; Silicon; Silicon carbide; Temperature measurement; X-rays;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location :
Knoxville, TN
Print_ISBN :
978-1-4244-9106-3
DOI :
10.1109/NSSMIC.2010.5873845