Title :
Four point probe method based on LOG112 and C8051F006 SoCs for resistivity measurement
Author :
Ekawita, Riska ; Rahmawati, E. ; Mikrajuddin Abdullah, K.
Author_Institution :
Phys. Dept., Universitas Bengkulu, Bengkulu, Indonesia
Abstract :
A four point probe-based resistivity meter using LOG112 and C8051F006 SoCs has been developed. The resistivity meter was calibrated and examined. Current-voltage characteristic-based resistances of resistors are consistent with those labeled to the resistors. Resistivities of the resistors are independent of the injected current, which agree with theory. The resistivity of TiO2 thin film depends on the injected current due to minority and/or majority carrier injection.
Keywords :
electric resistance measurement; electrical resistivity; resistors; semiconductor materials; semiconductor thin films; system-on-chip; titanium compounds; C8051F006 SoC; LOG112 SoC; TiO2; current-voltage characteristic; four point probe-based resistivity meter; majority carrier injection; minority carrier injection; resistances; resistivities; resistors; thin film; Calibration; Conductivity measurement; Current measurement; Electrodes; Microcontrollers; Probes; Resistors; System-on-a-chip; Voltage; Voltmeters; C8051F006; Four point probe; I-V curve; LOG112; SoC;
Conference_Titel :
Instrumentation, Communications, Information Technology, and Biomedical Engineering (ICICI-BME), 2009 International Conference on
Conference_Location :
Bandung
Print_ISBN :
978-1-4244-4999-6
Electronic_ISBN :
978-1-4244-5000-8
DOI :
10.1109/ICICI-BME.2009.5417218
