• DocumentCode
    3527586
  • Title

    Micropattern gas detector technologies and applications the work of the RD51 collaboration

  • Author

    Pinto, Serge Duarte

  • Author_Institution
    CERN, Geneva, Switzerland
  • fYear
    2010
  • fDate
    Oct. 30 2010-Nov. 6 2010
  • Firstpage
    802
  • Lastpage
    807
  • Abstract
    The RD51 collaboration was founded in April 2008 to coordinate and facilitate efforts for development of micropattern gaseous detectors (MPGDS). The 75 institutes from 25 countries bundle their effort, experience and resources to develop these emerging micropattern technologies. MPGDS are already employed in several nuclear and high-energy physics experiments, medical imaging instruments and photodetection applications; many more applications are foreseen. They outperform traditional wire chambers in terms of rate capability, time and position resolution, granularity, stability and radiation hardness. RD51 supports efforts to make MPGDS also suitable for large areas, increase cost-efficiency, develop portable detectors and improve ease-of-use. The collaboration is organized in working groups which develop detectors with new geometries, study and simulate their properties, and design optimized electronics. Among the common supported projects are creation of test infrastructure such as beam test and irradiation facilities, and the production workshop.
  • Keywords
    nuclear electronics; position sensitive particle detectors; MPGD; RD51 collaboration; beam test; high-energy physics experiments; irradiation facilities; medical imaging instruments; micropattern gas detector technologies; nuclear physics experiments; photodetection applications; portable detectors; position resolution; production workshop; radiation hardness; rate capability; test infrastructure; time resolution; wire chambers; Collaboration; Detectors; Discharges; Energy resolution; Gas detectors; Strips; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
  • Conference_Location
    Knoxville, TN
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-9106-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2010.5873870
  • Filename
    5873870