• DocumentCode
    3527621
  • Title

    Improved field emission properties of CdSe deposited single-walled carbon nanotubes emitter

  • Author

    Park, Taehee ; Lee, Jungwoo ; Lee, Wonjoo ; Ahn, Juwon ; Yi, Whikun

  • Author_Institution
    Dept. of Chem., Hanyang Univ., Seoul, South Korea
  • fYear
    2009
  • fDate
    20-24 July 2009
  • Firstpage
    275
  • Lastpage
    276
  • Abstract
    The field emission (FE) properties of single-walled carbon nanotubes (SWNTs) are of great importance, especially in applications involving flat panel display devices such as field emission displays (FED). The electron emitters of the FED must be long-lived and stable, and possess a low turn-on threshold voltage and a high current density at a given external field. In general, the emission source should have highly oriented and well-distributed tubes in order to utilize the characteristics of the nanotubes for FE. A notable method using plasma for the synthesis of the aligned CNTs was developed by Ren et al. We report the modified field emitter of CdS quantum-dot deposited on SWNTs (DcS/SWNTs). As a II-VI semiconductor compound, CdS has attracted considerable interest in optoelectronic application because of its relatively low electron affinity, high chemical inertness and sputter resistance.
  • Keywords
    II-VI semiconductors; cadmium compounds; carbon nanotubes; current density; electron affinity; field emission displays; flat panel displays; semiconductor quantum dots; C-CdSe; II-VI semiconductor; chemical inertness; current density; electron affinity; field emission displays; flat panel display; quantum dot; single walled carbon nanotubes emitter; sputter resistance; Carbon nanotubes; Current density; Electron guns; Flat panel displays; Iron; Plasma applications; Plasma chemistry; Plasma density; Plasma properties; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2009. IVNC 2009. 22nd International
  • Conference_Location
    Shizuoka
  • Print_ISBN
    978-1-4244-3587-6
  • Electronic_ISBN
    978-1-4244-3588-3
  • Type

    conf

  • DOI
    10.1109/IVNC.2009.5271655
  • Filename
    5271655