Title :
Use of Triple Modular Redundancy (TMR) technology in FPGAs for the reduction of faults due to radiation in the readout of the ATLAS monitored drift tube (MDT) chambers
Author :
Fras, M. ; Kroha, H. ; Loeben, J.V. ; Reimann, O. ; Richter, R. ; Weber, B.
Author_Institution :
Max-Planck-Inst. fur Phys., München, Germany
fDate :
Oct. 30 2010-Nov. 6 2010
Abstract :
The Triple Modular Redundancy (TMR) technology allows protection of the functionality of FPGAs against single event upsets (SEUs). Each logic block is implemented three times with a 2-out-of-3 voter at the output. Thus, the correct logical value is available even if there is an upset bit in one location. We applied TMR to the configuration code of a Virtex-II-2000 FPGA, which serves as the on-chamber readout processor of the ATLAS monitored drift tubes (MDTs). We describe the code implementation, results of performance measurements and discuss several limitations of the method. Finally, we present a supplementary technology called “scrubbing”. It permanently checks the configuration memory while the FPGA is operating, and corrects upset configuration bits when necessary.
Keywords :
drift chambers; field programmable gate arrays; nuclear electronics; readout electronics; ATLAS monitored drift tube chambers; Virtex-II-2000 FPGA; configuration code; configuration memory; logic block; onchamber readout processor; scrubbing technology; single event upsets; triple modular redundancy technology; upset configuration bits; Clocks; Electron tubes; Field programmable gate arrays; Microprogramming; Radiation effects; Single event upset; Tunneling magnetoresistance;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location :
Knoxville, TN
Print_ISBN :
978-1-4244-9106-3
DOI :
10.1109/NSSMIC.2010.5873878